Built-in self-test method based on on-chip embedded microsystem and its internal fpga resources

Abstract

A built-in self-test method based on an on-chip embedded microsystem and its internal FPGA resources is used to test the internal FPGA resources of the microsystem chip. Considering the limitation of single-chip FPGA resource utilization, each resource to be tested corresponds to multiple test files, and all test files are stored in the embedded microsystem memory. According to the test sequence, the test file is loaded in time by simulating the SelectMAP sequence through the internal processor of the embedded microsystem. Test files can also be updated online via the internal processor. The corresponding FPGA input and output signals during the test are also provided or detected by the internal processor of the microsystem. The method of the invention relies on the resources of the microsystem chip itself to realize the functional test of the internal FPGA of the microsystem, and does not need external complicated control and storage devices, nor does it need large-scale testing equipment, which greatly simplifies system design. Using SelectMap mode loading, the test efficiency is greatly improved. Test files can also be updated online, making the test system more flexible.

Description

technical field [0001] The invention relates to a built-in self-test method based on an embedded microsystem on a chip and its internal FPGA resources, in particular to an embedded microsystem on a chip and an FPGA resource including an internal processor unit and an FPGA unit based on an embedded microsystem on a chip A testing method belongs to the field of integrated circuit design. Background technique [0002] With the development of integrated circuits and electronic technology, the demand for integration, miniaturization, low power consumption and high reliability of integrated circuits has become increasingly strong. The traditional method of integrating discrete resources such as processors, FPGAs, and storage on the board makes the electronic system large in size, high in power consumption, and complex in design, which is not conducive to system integration and application. In recent years, the embedded microsystem chip that integrates discrete devices such as pro...

AI Technical Summary

Problems solved by technology

[0004] The problem solved by the technology in the present invention is: Aiming at the problems that the test system required by the traditional test method is complex, expensive, test coverage rate is not high, and test efficiency is low, a self-built system based on the embedded microsystem and its internal FPGA resources is proposed. The test method, which improves the test coverage rate of the FPGA resource of the microsystem chip without increasing the complexity of the microsystem chip design, simplifies the hardware design of the test system, accelerates the test speed of the FPGA resource, and improves the test efficiency. efficiency

Images