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tdi photosensitive device and image sensor for suppressing image mismatch

A technology of image sensors and photosensitive devices, which is applied in image communication, color TV parts, TV system parts, etc., and can solve problems such as reduced image sensor resolution, limited space for noise suppression, and increased layout design complexity. , to achieve the effect of saving the cost of image correction in the later stage, improving the signal-to-noise ratio, and saving the cost of image correction

Active Publication Date: 2020-08-14
GPIXEL
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in specific applications, there are differences between the scanning direction of the image sensor and the motion of the object, such as the crosstalk of the image between the column pixels caused by the lateral motion, such as Figure 2a , Figure 2b As shown, this leads to a reduction in the resolution of the image sensor, and in severe cases, image smearing occurs, so image correction is required in the later stage
At the same time, because the charge domain TDI technology first accumulates the signal and then outputs it, the computer algorithm cannot fundamentally correct the image
At the same time, the TDI signal-to-noise ratio is positively correlated with its series, but the increase of the series will not only increase the complexity of layout design, but also rapidly reduce the chip yield
Although the digital domain mode can correct the image first and then accumulate the signal, since the signal will introduce readout noise during readout, the signal-to-noise ratio can only be improved times, the space for noise suppression is very limited

Method used

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  • tdi photosensitive device and image sensor for suppressing image mismatch
  • tdi photosensitive device and image sensor for suppressing image mismatch
  • tdi photosensitive device and image sensor for suppressing image mismatch

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Embodiment 1

[0035] Such as Figure 7 As shown, the image sensor of the present invention comprising a TDI photosensitive device for suppressing image mismatch also includes a storage operation area; in terms of physical structure, the photosensitive device is composed of K separated TDI photosensitive sub-arrays, and the number of stages of the TDI photosensitive sub-arrays can be determined according to the specific Requirement design, all TDI photosensitive sub-arrays must be integrated on the same chip; there is a gap between adjacent TDI photosensitive sub-arrays, and the pixel signals of each column of TDI photosensitive sub-arrays are transferred to the storage operation area through the transfer circuit in the gap. In order not to lose the pixel signal of the object image, the gap space needs to be made very narrow, and at the same time, the transfer circuit needs to be placed, so in principle, the gap width is within 1 to 10 pixel sizes. The storage operation area includes a stora...

Embodiment 2

[0044] Such as Figure 8 As shown, the image sensor comprising the TDI photosensitive device for suppressing image mismatch of the present invention also includes an analog-to-digital conversion area and a storage operation area; in physical structure, the photosensitive device is composed of K separated TDI photosensitive sub-arrays, and the TDI photosensitive sub-array The number of stages can be designed according to specific requirements. All TDI photosensitive sub-arrays must be integrated on the same chip; there are gaps between adjacent TDI photosensitive sub-arrays, and the pixel signals of TDI photosensitive sub-arrays are transferred to the storage operation area through the transfer circuit in the gap. In order not to lose the pixel signal of the object image, the gap space needs to be made very narrow, and at the same time, the transfer circuit needs to be placed, so in principle, the gap width is within 1 to 10 pixel sizes. The storage operation area includes a st...

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Abstract

The TDI photosensitive device for suppressing image mismatch of the present invention is composed of K rows of separated TDI photosensitive sub-arrays integrated on the same chip, and the transfer corresponding to each TDI photosensitive sub-array is arranged in the gap between adjacent TDI photosensitive sub-arrays. circuit. The pixel signals collected by each TDI photosensitive sub-array are transferred to the outside through the transfer circuit, and the pixel signals of the TDI photosensitive sub-arrays in the 2nd to k rows are shifted externally to match the pixel signals of the same column, and then the pixels of each column The signals are accumulated to obtain a corrected image. The invention completely solves the problem of image mismatch, greatly improves the quality of TDI images, and can save the cost of later image correction.

Description

technical field [0001] The invention belongs to the technical field of integrated circuit image sensors, and in particular relates to a TDI image sensor. Background technique [0002] Time Delay Integration (TDI) is an imaging technology widely used in image sensors. The pixels of the sensor row expose the same part of the object successively, and finally the light signals of each column of pixels are accumulated to improve the photosensitive ability of the detector in the low-light environment, and make up for the shortcomings of the image sensor in the low-light environment that the energy acquisition is insufficient. The traditional TDI photosensitive device is an overall CCD array, which is divided into charge domain accumulation and digital domain accumulation according to the signal accumulation method. When the number of TDI stages of the image sensor is N, the charge-domain TDI technology directly accumulates the generated photoelectric charges N times, and the sign...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/372H04N5/378
CPCH04N25/71H04N25/75
Inventor 王欣洋马成周泉李杨武大猷
Owner GPIXEL
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