Device and method for measuring secondary electron emission coefficient of metal materials in low energy range

A technology of secondary electron emission and metal materials, which is applied in the direction of measurement devices, material analysis by measuring secondary emissions, and analysis of materials. It can solve the problems of lack of testing capabilities and expensive testing systems, and achieve improved measurement efficiency and device Build flexibility and cost-reduced effects
CN108387597BActive Publication Date: 2021-02-05XIAN INSTITUE OF SPACE RADIO TECH
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Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Patents(China)
Current Assignee / Owner
XIAN INSTITUE OF SPACE RADIO TECH
Publication Date
2021-02-05

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Abstract

The invention relates to an apparatus and a method for measuring the secondary electron yield of a metal material within a low energy range. The apparatus comprises a collection pole, two ammeters andan electron gun, wherein the collection pole has two layer and has a downward opening, the top portion of the structure of the collection pole is provided with a reservation hole, the upper surface of a sample is placed in the collection pole and is positioned just below the reservation hole, the electron gun shoots incident electrons onto the sample through the reservation hole, one ammeter as the ammeter A is connected between the sample and the ground, the other ammeter as the ammeter B is connected between the inner surface of the collection pole and the ground, and the outer surface of the collection pole is grounded.
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Description

technical field

[0001] The invention relates to a method for measuring the secondary electron emission coefficient of a metal material in a low energy range, belonging to the field of microdischarge of microwave components. Background technique

[0002] The micro-discharge effect is an important factor affecting the performance and reliability of high-power microwave components of spacecraft, and the secondary electron emission coefficient has a significant impact on the micro-discharge threshold; in order to establish a secondary electron emission model on the surface of microwave components, it is necessary to accurately measure the secondary electron Emission coefficient: International studies have shown that the secondary electron emission coefficient in the low energy range has a significant impact on the micro-discharge threshold.

[0003] At present, most of the secondary electron emission characteristic measurement platforms at home and abroad can only measure the se...

Claims

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