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Insertion loss test bar

A technology of insertion loss and test strips, which is applied in the direction of measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., to achieve the effects of weakening resonance effects, shortening length, and saving production costs

Active Publication Date: 2018-08-24
DONGGUAN SHENGYI ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] The purpose of the present invention is to provide an insertion loss test strip, which overcomes the defect that the test accuracy is affected by the stub resonance effect in the prior art when the back-drilling process is not used for via holes

Method used

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Embodiment Construction

[0033] In order to make the purpose, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the following The described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0034] Since the stub resonance effect is caused by the stub via hole, and the longer the stub stub is, the more obvious the stub resonance effect is, so the present invention will shorten the length of the stub via hole without using the back-drilling process. The way to effectively weaken the stub resonance effect and improve the test a...

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Abstract

The invention discloses an insertion loss test bar, and relates to the technical field of PCB. The test bar comprises two surface layers and at least one to-be-tested signal wiring layer along the lamination direction as well as at least one test pad group in one to one correspondence with the to-be-tested signal wiring layer; each to-be-tested signal wiring layer positioned in the internal is connected with the corresponding test pad group via a through hole, and the corresponding test pad group is arranged in the specific surface layer; and the through hole does not undergo back drilling, and the specific surface layer is the first or second surface layer with a longer vertical distance to the to-be-tested signal wiring layer. On the premise that back drill is not carried out on the through hole, the test pad group is far from the corresponding signal wiring layer, the stub length of the through hole is reduced, the production cost is reduced due to the back drill technology is not used, the weak stub resonance effect can be reduced effectively, and the insertion loss can be tested more accurately.

Description

technical field [0001] The invention relates to the technical field of PCB (Printed Circuit Board, printed circuit board), in particular to an insertion loss test strip applied to a PCB. Background technique [0002] As PCB products gradually enter the high-speed and high-frequency field, the insertion loss characteristics of signal lines at different frequencies are gradually being paid attention to. For this reason, insertion loss test strips are gradually designed on PCB products to monitor the insertion loss characteristics of PCB products. [0003] The insertion loss test strip commonly used in the industry usually connects the differential signal lines of the inner layer through via holes, so as to realize the monitoring and testing operation of the inner layer signal on the surface layer of the insertion loss test strip. In order to reduce the cost, a large number of insertion loss test strips do not use the via back drilling process, but this will cause discontinuit...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/26
CPCG01R27/26
Inventor 孙梁纪成光杜红兵肖璐陈正清王善进
Owner DONGGUAN SHENGYI ELECTRONICS