Integrated circuit aging test device
A kind of technology of aging test and integrated circuit, which is applied in the direction of electronic circuit test, measuring device, and measuring electricity. environment and the effect of improving reliability
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[0027] Embodiment 1 The integrated circuit burn-in test device of the present invention comprises the high-temperature test chamber 1 for heating the test device, the burn-in test board 2 for carrying out the burn-in test, and the burn-in integrated circuit board for controlling each burn-in test board 3. A signal generator for sending excitation signals 4. A power control board for providing adjustable DC voltage 5. A signal detector for detecting aging input and output signals, and an aging aging circuit for providing the required voltage to the aging test board A power supply 6 and a controller for controlling the aging process, wherein each channel is configured with a set of signal detectors;
[0028] The high temperature test chamber 1 includes a casing, a thermostat and a heat dissipation ventilation device, and the casing is provided with a test device loading area 11 for placing test devices, a control chamber for installing a power control board 5 and a signal generat...
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