Integrated circuit aging test device

A kind of technology of aging test and integrated circuit, which is applied in the direction of electronic circuit test, measuring device, and measuring electricity. environment and the effect of improving reliability

Pending Publication Date: 2018-09-11
杭州可靠性仪器厂
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, the integrated circuit aging test device commonly used in China has problems such as low signal frequency, insufficient signal depth, low transmission efficiency, and incomplete signal return inspection; in the test project, it is impossible to obtain real-time recorded data and confirmation of the validity of the data.

Method used

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Examples

Experimental program
Comparison scheme
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Embodiment 1

[0027] Embodiment 1 The integrated circuit burn-in test device of the present invention comprises the high-temperature test chamber 1 for heating the test device, the burn-in test board 2 for carrying out the burn-in test, and the burn-in integrated circuit board for controlling each burn-in test board 3. A signal generator for sending excitation signals 4. A power control board for providing adjustable DC voltage 5. A signal detector for detecting aging input and output signals, and an aging aging circuit for providing the required voltage to the aging test board A power supply 6 and a controller for controlling the aging process, wherein each channel is configured with a set of signal detectors;

[0028] The high temperature test chamber 1 includes a casing, a thermostat and a heat dissipation ventilation device, and the casing is provided with a test device loading area 11 for placing test devices, a control chamber for installing a power control board 5 and a signal generat...

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PUM

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Abstract

The integrated circuit aging test apparatus of the present invention comprises a high temperature test chamber for heating a test device, aging test boards for performing aging test, an integrated circuit board for controlling each aging test board, a signal generator for emitting an excitation signal, a power supply control board for providing adjustable DC voltage, a signal detector for detecting aging input and output signals, an aging power supply for supplying the required voltage to the aging test boards, and a controller for controlling the aging process. The high temperature test chamber includes a box body and a temperature controller; the box body includes a test device loading area for placing the test device, a control cavity for mounting the power supply control board and thesignal generator, and a power supply placement cavity for holding an aging power supply; and the aging test boards are mounted in the test device loading area of the box body. The invention has the advantages of high signal quality and good high-fidelity integrity of the long-distance transmission signal.

Description

technical field [0001] The invention relates to an integrated circuit aging test device. Background technique [0002] At present, IC aging test devices commonly used in China have problems such as low signal frequency, insufficient signal depth, low transmission efficiency, and incomplete signal return inspection; real-time recorded data and confirmation of data validity cannot be obtained in the test project. Contents of the invention [0003] In order to overcome the disadvantages of low signal frequency and long-distance transmission attenuation of existing equipment, the invention provides an integrated circuit aging test device with high signal quality and high fidelity and integrity of long-distance transmission signals. [0004] The integrated circuit burn-in test device of the present invention is characterized in that: comprise the high-temperature test box that is used for heating test device, be used to carry out burn-in test board, be used to control the integ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2875G01R31/2862G01R31/2863G01R31/2879
Inventor 曹骥吴福铭任旭东
Owner 杭州可靠性仪器厂
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