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Quick three-dimensional measurement method based on sinusoidal and binary fringe projection

A fringe projection and three-dimensional measurement technology, which is applied in the field of optical measurement, can solve the problems of affecting the measurement speed and time-consuming, and achieve the effect of improving the measurement speed, reducing the number of frames, and improving the three-dimensional measurement speed

Active Publication Date: 2018-09-14
SHANGHAI SUPORE INSTR
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In traditional measurement methods, usually more than six fringe images are required to achieve absolute phase measurement, which takes a long time and directly affects the measurement speed

Method used

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  • Quick three-dimensional measurement method based on sinusoidal and binary fringe projection
  • Quick three-dimensional measurement method based on sinusoidal and binary fringe projection
  • Quick three-dimensional measurement method based on sinusoidal and binary fringe projection

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Embodiment Construction

[0041] It is easy to understand that, according to the technical solution of the present invention, those skilled in the art can imagine various implementations of the grating fringe phase solution method for three-dimensional measurement of the present invention without changing the essence of the present invention. Therefore, the following specific embodiments and drawings are only exemplary descriptions of the technical solution of the present invention, and should not be regarded as the entirety of the present invention or as a limitation or limitation on the technical solution of the present invention. The examples of the present invention are described in further detail below in conjunction with the accompanying drawings, but the examples are not intended to limit the present invention, and all similar structures and similar changes of the present invention should be included in the protection scope of the present invention.

[0042] to combine figure 2 Flow chart, a ki...

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Abstract

The invention discloses a quick three-dimensional measurement method based on sinusoidal and binary fringe projection. The quick three-dimensional measurement method based on sinusoidal and binary fringe projection includes the steps: generating three sinusoidal phase shifting fringe diagrams and a binary fringe diagram through a computer; sequentially projecting the four fringe diagrams to the surface of a measured object through the projector, and acquiring each projected diagram through a camera; solving the parcel phase by means of the three sinusoidal phase shifting fringe diagrams; performing image filtering preprocessing by means of the binary fringe diagram, performing binary processing on the preprocessed image, performing marking on the communicated region, performing comparisonassignment operation, and finally performing phase shifting coding double operation to obtain the fringe level of all the pixel points; performing phase unwrapping to obtain the absolute phase for three-dimensional reconstruction; and performing three-dimensional reconstruction and phase-height conversion. The quick three-dimensional measurement method based on sinusoidal and binary fringe projection can perform phase solution and parcel unwrapping only by using the four structured light fringe diagrams, and can perform more measurements at the same time and the same measurement precision, thus improving the three-dimensional measurement speed.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, in particular to a fast three-dimensional measurement method based on sinusoidal and binary fringe projection. Background technique [0002] The optical three-dimensional measurement technology based on fringe projection has the advantages of non-contact, high efficiency, high precision and high degree of automation, and is currently the most promising three-dimensional measurement method. 3D measurement systems such as figure 1 As shown, it includes DLP projector 1, CCD2, workstation 3, measurement bracket 4, reference plane 5 and object 6 to be measured; DLP projector 1 and CCD2 are placed on measurement bracket 4; DLP projector 1 and CCD2 pass data lines respectively The workstation 3 is connected; the object to be measured 6 is placed on the reference plane 5; the workstation 3 includes an image acquisition card, projection software, and measurement software. The DLP projector 1...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
Inventor 伏燕军王霖陈元
Owner SHANGHAI SUPORE INSTR
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