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Device and method to generate integrated circuit inherent information

A technology of inherent information and generating device, applied in the direction of protection of internal/peripheral computer components, etc., which can solve the risk and improvement of inherent information leakage

Active Publication Date: 2018-09-14
MACRONIX INT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, inherent information generated in this way can be obtained from structural changes in memory devices (such as polysilicon fuses (Poly-Fuse) by scanning electron microscopy (SEM) or transmission electron microscopy (TEM). ) or oxide anti-fuse (Oxide Anti-Fuse)) reverse extraction, which increases the risk of inherent information leakage

Method used

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  • Device and method to generate integrated circuit inherent information
  • Device and method to generate integrated circuit inherent information
  • Device and method to generate integrated circuit inherent information

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Embodiment Construction

[0026] Herein, some embodiments of the present invention are described in detail with reference to the accompanying drawings, but not all embodiments are shown in the drawings. Indeed, these inventions can use many different variations and are not limited to the examples herein. Rather, the present invention provides these embodiments to meet the statutory requirements of the application. The same reference symbols are used in the drawings to designate the same or similar elements.

[0027] figure 1 A block diagram of an inherent information generating device 10 according to an embodiment of the present invention is shown. The inherent information generating device 10 is suitable for an integrated circuit, such as a chip. The intrinsic information generating device 10 is, for example, a Physical Unclonable Function (PUF) circuit, which can generate the intrinsic information IF of the integrated circuit. The inherent information IF is, for example, a set of n bits B 0 ~B ...

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Abstract

An inherent information generating device applicable to an integrated circuit comprises a plurality of source storage unit pairs and a comparator circuit. One of the source storage unit pair includesa first source storage unit having a first electrical parameter value and a second source storage unit having a second electrical parameter value. The comparator circuit is coupled to the source storage unit pairs in order to generate inherent information of the integrated circuit. The comparator circuit includes a first comparator. The first comparator is coupled to the first source storage unitsand the second source storage units in order to compare the first electrical parameter value and the second electrical parameter value, thereby generating a bit value for a first bit of the inherentinformation according to the comparation results.

Description

technical field [0001] The invention relates to a device and method for generating integrated circuit inherent information. Background technique [0002] In order to ensure the safety of data exchange or control operations, many applications often need to use the inherent information of integrated circuits (such as chips) to identify verification operations. The inherent information of the integrated circuit can be, for example, the identity identifier of the integrated circuit, which can be used in data encryption operations to generate keys. [0003] There are currently many ways to generate information intrinsic to integrated circuits, such as generating codes through external management. However, inherent information generated in this way can be obtained from structural changes in memory devices (such as polysilicon fuses (Poly-Fuse) by scanning electron microscopy (SEM) or transmission electron microscopy (TEM). ) or Oxide Anti-Fuse (Oxide Anti-Fuse)) reverse extracti...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F21/75
CPCG06F21/75
Inventor 李明修
Owner MACRONIX INT CO LTD