Phased array linear array probe wedge with focusing characteristic

Abstract

The invention relates to a phased array linear array probe wedge with a focusing characteristic. The phased array linear array probe wedge comprises a first sub-wedge and a second sub-wedge which aresequentially arranged from top to bottom, the sound velocity of the first sub-wedge is c1, the acoustic impedance of the first sub-wedge is Z1, the sound velocity of the second sub-wedge is c2, the acoustic impedance of the second sub-wedge is Z2, the sound velocity c1 of the first sub-wedge is greater than the sound velocity c2 of the second sub-wedge, and the acoustic impedance Z1 of the first sub-wedge is smaller than the acoustic impedance Z2 of the second sub-wedge; and the interface between the first sub-wedge and the second sub-wedge is a circular arc surface, and the horizontal position of the central axis of the circular arc surface is positioned at the horizontal center of the wedge. The acoustic impedance of the first sub-wedge is matched with the acoustic impedance of the second sub-wedge to improve the ultrasonic wave transmittance of a linear array probe wafer / first sub-wedge interface, the first sub-wedge / second sub-wedge interface and a second sub-wedge / detected workpiece interface, so the phased array linear array probe wedge with the focusing characteristic has a better sound transmitting effect than a traditional phased array wedge; and the contact surface of thewedge and the surface of the detected workpiece is a plane, so the coupling effect in the detection process is maximally ensured.

Description

technical field [0001] The invention belongs to the field of phased array ultrasonic non-destructive testing, in particular to a phased array linear array probe wedge with focusing characteristics. Background technique [0002] Phased array probe wedges are mainly used to cooperate with phased array probes to achieve functions such as probe protection, sound beam delay or sound beam deflection. When testing materials with high acoustic attenuation such as nickel-based alloys and austenitic stainless steel, it is necessary to obtain an acoustic beam with a smaller focal spot size, so as to improve the detection sensitivity and resolution, and achieve effective detection of small defects. [0003] At present, the chip arrangement form of the most widely used phased array probes in on-site detection work is one-dimensional linear, referred to as linear array. However, the linear array probe only performs acoustic beam focusing parallel to the arrangement direction of the wafer...

AI Technical Summary

Problems solved by technology

[0004] Changing the chip layout of the phased array probe (such as changing the linear array to a two-dimensional matrix) can reduce the focus size, but the manufacturing process of the two-dimensional matrix probe is complicated, expensive, and requires high requirements for the supporting phased array instrument

Equipped with a wedge with geometric focusing function to reduce the focus size, but the coupling surface of the wedge has a certain curvature, which affects the coupling effect with the inspected workpiece during the inspection process

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