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Spectrometer with a two-dimensional spectrum

A two-dimensional spectrum and spectrometer technology is applied in the field of spectrometer devices to achieve the effects of improving image quality and reducing imaging errors

Active Publication Date: 2018-11-02
耶拿分析仪器股份公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Other imaging errors are not considered

Method used

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  • Spectrometer with a two-dimensional spectrum
  • Spectrometer with a two-dimensional spectrum
  • Spectrometer with a two-dimensional spectrum

Examples

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Embodiment Construction

[0073] figure 1 is a schematic illustration of a particularly simple spectrometer arrangement 10 . The spectrometer device 10 comprises an entrance slit 15 , an off-axis parabola serving as a collimating mirror 17 , a rear mirror prism 21 and an echelle grating 31 . A detector 39 for receiving the generated spectrum is arranged in the exit plane of the spectrometer device 10 . Arranged upstream of the detector 39 is a deflection mirror 35 which deflects the scattered radiation in the direction of the detector 39 . The top edge 22 of the prism 21 extends substantially vertically in the figure. Lines 30 indicate the reticle lines of the echelle grating 31 .

[0074] The spectrometer device 10 comprises, in addition to the optical components described above, further components such as housing, base plate, holding and adjustment means, mechanical drives and electrical components for controlling the optical components and receiving and evaluating the signal on the detector 39 . ...

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Abstract

A spectrometer assembly (10) with a two-dimensional spectrum comprising a first dispersing element (31) for the spectral decomposition of radiation in a main dispersion direction, an imaging optical system (17) for imaging in an image plane the radiation penetrating through an inlet gap (15) in the spectrometer arrangement (10) and enabling a two-dimensional spectrum to be produced, and a surfacedetector (39) with a two-dimensional arrangement of a plurality of detector elements in the image plane. Said spectrometer assembly is characterized in that a reflector, a refractor, a lens array or another optical element is arranged in the beam path at a point where the dispersed, monochromatic bundles are present in a separated manner, and the reflector, the refractor, the lens array or the other optical element have a surface in the form of a free-form surface wherein the surface occupied by the selected images of the inlet gap at different wavelengths in the image plane is optimised overa selected spectral range of the two-dimensional spectrum.

Description

technical field [0001] The invention relates to a spectrometer device with a two-dimensional spectrum, comprising: [0002] (a) a first dispersive element for spectral decomposition of radiation in the principal dispersion direction, [0003] (b) imaging optics for imaging at the image plane radiation entering the spectrometer arrangement through the entrance slit to produce a two-dimensional spectrum, and [0004] (c) A detector array having a plurality of detector elements arranged two-dimensionally in the image plane. [0005] An example of such a spectrometer arrangement is an echelle spectrometer with internal order separation. Another example is a long slit spectrometer setup. [0006] In the case of an echelle spectrometer, a grating with a stepped (echelle means step in French) cross-section is used. Through the step-like structure with corresponding blaze angles, a diffraction pattern that concentrates the diffraction intensity of higher orders, such as the fiftie...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/14G01J3/18G01J3/02G01J3/28
CPCG01J3/14G01J3/2803G01J2003/1828G01J3/0208G01J3/1809G01J3/2823
Inventor 斯特凡·明希米夏埃尔·奥克鲁斯
Owner 耶拿分析仪器股份公司