Method for detecting interface defects and interface states of post insulator
A technology for pillar insulators and interface defects, which is applied to measuring devices, material analysis through optical means, instruments, etc., can solve the problem of non-fitting at the interface, electric field distortion of pillar insulators, unsatisfactory accuracy, feasibility and ease of operation, etc. problems, to achieve the effect of meeting the requirements of the evaluation work, high detection accuracy, and strong operability
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[0053]In order to more clearly understand the above objects, features and advantages of the embodiments of the present invention, the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, in the case of no conflict, the features in the embodiments of the present application may be combined with each other.
[0054] In the following description, many specific details are set forth in order to fully understand the embodiments of the present invention, and the described implementations are only part of the implementations of the present invention, but not all of them. Based on the implementation manners in the present invention, all other implementation manners obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the embodiments of the present invention.
[0055] Unless defined otherwise, all technical and scientific terms us...
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