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Electro-optic modulation double-comb shape measuring device and its calibration method

An electro-optic modulation and shape measurement technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of inability to measure values, slow measurement speed, and high precision, and achieve convenient verticality calibration, easy installation, and high The effect of ranging accuracy in the z direction

Active Publication Date: 2021-01-29
TIANJIN UNIV
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Problems solved by technology

The visual method suitable for the surface of a large object can measure a large area, but it is limited by the performance of the camera, and it is difficult to obtain very accurate measurement accuracy; Slow, and all belong to the incremental measurement method. When encountering a large undulating surface or a stepped surface, the value cannot be measured
At present, the industrial field lacks a three-dimensional measurement technology that is compatible with large and small measured surfaces, high precision, and strong robustness.

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  • Electro-optic modulation double-comb shape measuring device and its calibration method
  • Electro-optic modulation double-comb shape measuring device and its calibration method
  • Electro-optic modulation double-comb shape measuring device and its calibration method

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Embodiment Construction

[0036] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0037] An electro-optical modulation dual-comb profile measurement device and a verification method thereof, the electro-optic modulation dual-optical comb profile measurement device comprising: an electro-optic modulation dual-comb generation module, used to generate optical frequencies with different center frequencies and repetition frequencies Comb; multi-heterodyne one-dimensional ranging module, used to measure the one-dimensional distance information of the measured object in the direction of its outgoing laser; two-dimensional motion module, used to drive the measured object to do spiral movement, and provide the measured object x The two-dimensional distance information in the direction and y direction; the calcul...

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Abstract

An electro-optical modulation dual-comb profile measurement device and a verification method thereof, the electro-optic modulation dual-optical comb profile measurement device comprising: an electro-optic modulation dual-comb generation module, used to generate optical frequencies with different center frequencies and repetition frequencies Comb; multi-heterodyne one-dimensional ranging module, used to measure the one-dimensional distance information of the measured object in the direction of its outgoing laser; two-dimensional motion module, used to drive the measured object to do spiral movement, and provide the measured object x The two-dimensional distance information in the direction and y direction; the calculation processing unit is used to integrate and analyze the distance information in the z direction, x direction and y direction of the measured object to generate the three-dimensional shape of the measured object. The electro-optic modulation dual-comb shape measuring device and its verification method of the present invention use a synthetic wavelength ranging device based on electro-optic modulation dual-combs, which can obtain high z-direction ranging accuracy, and the device is easy to adjust and can be conveniently implemented Verticality calibration and other work.

Description

technical field [0001] The invention belongs to the technical field of three-dimensional shape measurement, and in particular relates to an electro-optic modulation double-comb shape measurement device and a verification method thereof. Background technique [0002] Three-dimensional shape measurement technology is widely used in quality inspection, integrated circuit manufacturing, industrial assembly and other fields. Traditional shape measurement technology only needs to be divided into two aspects: the visual method suitable for the surface of large objects and the method suitable for small objects. White light interferometry technology and probe method measurement technology for shape measurement. The visual method suitable for the surface of a large object can measure a large area, but it is limited by the performance of the camera, and it is difficult to obtain very accurate measurement accuracy; Slow, and all belong to the incremental measurement method. When encoun...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/245
CPCG01B11/245
Inventor 赵显宇张福民李雯靓汤国庆曲兴华
Owner TIANJIN UNIV
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