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A Calculation Method and Device of Non-overlapping Community Set Quality Index

A quality measurement and calculation method technology, applied in the computer field, can solve problems such as the inapplicability of large-scale community collection quality measurement indicators calculation, etc., to achieve the effect of rich measurement indicators and accelerated computing speed

Active Publication Date: 2021-10-29
SHENZHEN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The main purpose of the present invention is to provide a method and device for calculating the quality metrics of non-overlapping community sets, aiming to solve the technical problem that existing algorithms are not suitable for the calculation of large-scale community set quality metrics

Method used

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  • A Calculation Method and Device of Non-overlapping Community Set Quality Index
  • A Calculation Method and Device of Non-overlapping Community Set Quality Index
  • A Calculation Method and Device of Non-overlapping Community Set Quality Index

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no. 1 example

[0071] There are many existing calculation methods for calculating the quality metrics of non-overlapping community sets, including igraph (complex network analysis library), scikit-learn (a python-based machine learning module), MPI-2014 (an algorithm based on MPI standards), etc. But these algorithms can only calculate part of the index, based on this, the present invention proposes a kind of calculation method MPI-PNCMC (MPI-Parallel Non-overlapping Community Metric Computation) of non-overlapping community set quality index newly, based on MPI standard parallel Community Metric Calculation), the algorithm is an algorithm of a parallel distributed framework. Compared with the existing algorithms, the calculation method of the present invention is faster and can calculate more abundant indicators.

[0072] The flow chart of the calculation method of the non-overlapping community set quality metric index provided by the first embodiment of the present invention can be found in...

no. 2 example

[0105] The non-overlapping community set quality metric calculation device provided by the present invention can be found in image 3 As shown, it includes a processor 301, a memory 302 and a communication bus 303, wherein:

[0106] The communication bus 303 is used to realize connection and communication between the processor 301 and the memory 302;

[0107] The processor 301 is configured to execute a non-overlapping community set quality metric calculation program stored in the memory 302, and the non-overlapping community set quality metric calculation program includes:

[0108] Obtaining module, used to obtain community set X={X 1 ,X 2 ,...X K}, Y={Y 1 ,Y 2 ,...Y K'}, and the vertex set V={v 1 ,v 2 ,...v n}; the K, K', and n respectively represent the number of elements in the community set X, Y and the vertex set V;

[0109] The processing module is used for according to the vertex set V={v 1 ,v 2 ,...v n} in each vertex v i , respectively traversing the co...

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Abstract

The present invention provides a method and device for calculating the quality metrics of non-overlapping community sets. The vertex set V is obtained by obtaining the elements in each community in the community sets X and Y, and according to each vertex v in the vertex set V i , respectively traversing the community collections X and Y to construct the community label data collection LidList, and then based on the grouping strategy of taking the modulus of the key of LidList, the collection LidList is segmented according to the key and distributed to each process, and each process calculates, and obtains Calculate the required values ​​of each indicator, and finally merge them into a single process for calculation, and obtain the measurement indicators of community sets X and Y. This method adopts the parallel distributed computing framework MPI and uses the community tag pair counting to accelerate the calculation speed of the community collection metrics. At the same time, more metrics can be calculated at the same time through the calculation method of the community collection quality metrics, which is suitable for large-scale community collections. Calculation of quality metrics.

Description

technical field [0001] The invention belongs to the field of computer technology, and in particular relates to a method and device for calculating a non-overlapping community set quality index. Background technique [0002] In general, a social network graph can be abstracted as a collection of nodes and edges, where nodes represent individuals in the network, and edges represent certain associations between individuals. The social network graph has a community structure, in which the community is composed of tightly connected nodes in the network graph, and the communities are connected by sparse nodes. Community discovery is to characterize and divide the community structure of a network, and the result of community discovery is called community set. If the nodes in the community set belong to only one community, the community set is called non-overlapping community set, otherwise it is called overlapping community set. It should be understood that the community sets gen...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/06
CPCG06Q10/06393G06Q10/06395
Inventor 冯禹洪吴远诗佘松罗秋明
Owner SHENZHEN UNIV
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