Buckle board testing device and method

Abstract

The invention discloses a buckle board test device and method, and relates to the technical field of communication. The test device comprises a test terminal, a test base plate and a test switching plate connected successively; the test switching plate is connected with a tested buckle board, a test terminal is connected with the tested buckle board via the test base plate and the test switching plate, and used to issue a test command to the tested buckle board and receive a test result reported by the tested buckle board; and the test base plate is used to provide a test circuit module whichis needed when the tested buckle board tests a hardware circuit to be tested according to the test command. Buckle board test is separated from single disc test, a tester determines the test result less difficultly, and can test multiple tested buckle boards at the same time, the test efficiency is improved, the problem that single disc test causes incomplete test of the buckle board, interferenceof a buckle board fault on single disc test is eliminated, and the first-pass yield of the single disc is improved.

Description

technical field [0001] The invention relates to the field of communication technology, in particular to a test device and a test method for a gusset. Background technique [0002] At present, the CPU of a single disk of a communication device is mostly plugged into the single disk in the form of a daughterboard, and each daughterboard is used to realize the control and management functions of the disk. The existing gusset test usually adopts the mode of indirect testing with the delivery order, and does not conduct a separate test on the gusset. The disadvantages of this method are as follows: (1) High requirements for testers. Testers need to monitor the single-disk test process through the test terminal PC, and manually analyze the test results of the single-disk to determine the hardware circuit problems of the single-disk and the hardware circuit of the sub-board. Not only is there more human-computer interaction, but also professional testers Quality requirements are h...

AI Technical Summary

Problems solved by technology

[0003] Aiming at the defects existing in the prior art, the object of the present invention is to provide a test device and method for a gusset plate, which separates the test of the gusset plate from the single plate test, reduces the difficulty of the tester in judging the test results, and facilitates the tester to judge the test results. Multiple tested gussets are tested at the same time to improve test efficiency, solve the problem of incomplete gusset testing caused by single-disc testing, eliminate the interference of gusset failures on single-disc testing, and improve the one-time pass rate of single-disk

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