Polycrystalline diamond compact surface defect classification and recognition method

A polycrystalline diamond, defect classification technology, applied in character and pattern recognition, image analysis, image data processing and other directions, can solve the problems of low detection accuracy, large human eye damage, low efficiency, etc., to achieve high classification and recognition rate, good quality. The effect of practicality

Inactive Publication Date: 2018-12-07
HUAQIAO UNIVERSITY
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AI Technical Summary

Problems solved by technology

Traditionally, most PDC manufacturers use manual visual inspection to identify and classify defects. Because the defect information is not obvious, it needs to be observed under strong light for a long time, which is harmful to human eyes.
Moreover, manual detection still has problems such as low detection accuracy, strong subjectivity, and low efficiency.

Method used

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  • Polycrystalline diamond compact surface defect classification and recognition method
  • Polycrystalline diamond compact surface defect classification and recognition method
  • Polycrystalline diamond compact surface defect classification and recognition method

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Embodiment Construction

[0025] The content of the present invention is specifically described below in conjunction with accompanying drawing:

[0026] During the production and processing of polycrystalline diamond composite sheets, the common surface defects mainly include white spots, cracks and white edges, etc., but the three defects hardly appear at the same time. Most of the white spots appear at the junction of the interface, white dots of different sizes; most of the cracks start from the bottom edge of the PCD chamfer and extend towards the junction of the interface, dark black and slender, with different lengths; most of the white edges appear on the Below the chamfered area of ​​the PCD layer, it is a long white strip with different widths. In order to facilitate the comparison and analysis of the three defects, the present invention establishes a defect feature model according to the generation process, position, size and shape characteristics of the three defects, and draws the three def...

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Abstract

The invention discloses a polycrystalline diamond compact surface defect classification and recognition method. The problems of manual detection such as strong subjectivity, low efficiency and the fact that accuracy and reliability of classification results cannot be guaranteed are solved, and high-efficiency, high-precision and automatic classification recognition of three kinds of defects, i.e.,a surface crack, a white point and a white edge of a polycrystalline diamond compact can be achieved.

Description

technical field [0001] The invention relates to a method for classifying and identifying surface defects of a polycrystalline diamond composite sheet. Background technique [0002] Polycrystalline diamond compact (hereinafter referred to as PDC) is sintered by polycrystalline diamond and cemented carbide under high temperature and high pressure. Because of its excellent performance, it is widely used in many fields such as petroleum exploration and machining. In the process of production and processing, defects such as cracks, white spots and white edges will inevitably appear on the surface area of ​​the side polycrystalline diamond layer (polycrystalline diamond, hereinafter referred to as PCD), which will affect the performance of the product. Therefore, strict defect detection and classification must be carried out on the surface of the finished product before the product is packaged. Traditionally, most PDC manufacturers use manual visual inspection to identify and cla...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06K9/62
CPCG06T7/0004G06T2207/10004G06T2207/20081G06T2207/30168G06T2207/30132G06F18/2411G06F18/214
Inventor 李慧慧郭桦崔长彩陈琛
Owner HUAQIAO UNIVERSITY
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