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A Transient Voltage Suppressor with Low Voltage and Low Capacitance Triggering Characteristics

A technology of transient voltage suppression and triggering characteristics, applied in the direction of electric solid devices, circuits, electrical components, etc., can solve the problems of large parasitic capacitance and weak anti-surge robustness, reduce parasitic capacitance and trigger voltage, improve Current bleeder capability, the effect of reducing device area

Active Publication Date: 2020-07-24
JIANGNAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Aiming at the problems of ESD protection and anti-surge robustness and large parasitic capacitance of traditional diode, MOS and SCR structures, the present invention proposes a transient voltage suppressor with low-voltage and low-capacitance trigger characteristics, through the SCR structure Embed MOS, diodes and special metal wiring design to form the current path of diode-assisted triggering SCR, and the current path of MOS-assisted triggering SCR, so as to reduce the trigger voltage of the device and improve the robustness of the device's electrical overstress

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  • A Transient Voltage Suppressor with Low Voltage and Low Capacitance Triggering Characteristics
  • A Transient Voltage Suppressor with Low Voltage and Low Capacitance Triggering Characteristics
  • A Transient Voltage Suppressor with Low Voltage and Low Capacitance Triggering Characteristics

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Embodiment Construction

[0023] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail;

[0024] The present invention proposes a transient voltage suppressor with low-voltage and low-capacitance trigger characteristics. By embedding diodes and NMOS, a series-parallel current path of auxiliary SCR is formed to reduce the trigger voltage of the device, reduce the area of ​​the device, and reduce the parasitic capacitance of the device. , Enhance the ESD protection or anti-surge function of the device.

[0025] Such as figure 1 The schematic cross-sectional structure of the device of the present invention shown is specifically a transient voltage suppressor with low-voltage and low-capacitance trigger characteristics, which is characterized in that: the transient voltage suppressor mainly includes: P substrate 101, N well 102, P well 103, first P+ implant region 104, first N+ implant region 105, second P+ implant region 106, second N+...

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Abstract

The invention relates to a transient voltage suppressor with low voltage and low capacitance triggering characteristics, belonging to the field of electrostatic discharge protection and surge resistance of integrated circuits. The suppressor comprises a P substrate, an N well, a P well, a first P + implantation region, a first N + implantation region, a second P + implantation region, a second N +implantation region, a polysilicon gate and a thin gate oxide layer covered by the polysilicon gate, a third N + implantation region and a metal line. By embedding MOS, diode and special metal wiringin the SCR structure, the current path of diode-assisted triggering SCR and the current path of MOS-assisted triggering SCR are formed to reduce the triggering voltage of the device and improve the electrical overstress robustness of the device. The device area and parasitic capacitance of the device can be reduced and ESD and surge protection efficiency of the device can be enhanced.

Description

technical field [0001] The invention belongs to the field of electrostatic discharge protection and anti-surge of integrated circuits, relates to an ESD protection or anti-surge device, in particular to a transient voltage suppressor with low-voltage and low-capacitance trigger characteristics, which can be used to improve on-chip IC and electronic Product reliability. Background technique [0002] With the wide application of integrated manufacturing technology and integrated circuits, portable electronic products are becoming more and more popular in daily life, which brings great convenience to people's life. However, the high failure rate of electronic products and the weak stability of circuit systems still bring great troubles to the current research and application of electronic engineering. According to the survey, electrostatic discharge or transient surge is the main factor causing failure of electronic products, especially IC. And because ESD or surge is a commo...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/02
CPCH01L27/0266H01L27/0296
Inventor 顾晓峰彭宏伟梁海莲
Owner JIANGNAN UNIV
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