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Display substrate and display device

A technology for display substrates and display areas, which is used in semiconductor/solid-state device components, semiconductor/solid-state device testing/measurement, semiconductor devices, etc., and can solve the problems of high toughness of the detection line, low detection rate, and false detection.

Active Publication Date: 2018-12-11
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in the current design, when the detection line is set thicker, the detection line has greater toughness, and when cracks occur in the packaging layer, the detection line will not break, resulting in a low detection rate; Thin enough to allow the detection line to break when the encapsulation layer is damaged, which will cause the resistance of the detection line to exceed the normal range when it is not broken, resulting in false detection

Method used

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  • Display substrate and display device
  • Display substrate and display device
  • Display substrate and display device

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Embodiment Construction

[0024] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0025] figure 1 It is a schematic diagram of the distribution of detection line groups in the display substrate provided by Embodiment 1 of the present invention, figure 2 is a cross-sectional view of the detection line group along its extending direction in Embodiment 1 of the present invention, combined with figure 1 and figure 2 As shown, the display substrate 10 includes a display area AA and a peripheral area BA. A crack detection circuit is arranged in the peripheral area BA. The crack detection circuit includes detection line groups 12, and each detection line group 12 includes at least two detection lines in parallel. 121 and 122, the layers of the ...

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Abstract

The invention provides a display substrate, comprising a display area and a peripheral area, wherein a crack detection circuit is arranged in the peripheral area, the crack detection circuit comprisesa detection line group, each detection line group comprises at least two detection lines in parallel, and the layers of each detection line in the same detection line group are different from each other. Accordingly, the present invention also provides a display device. The invention can improve the detection accuracy rate of the display substrate when the crack detection is carried out.

Description

technical field [0001] The present invention relates to the field of display technology, in particular to a display substrate and a display device. Background technique [0002] In the manufacturing process of an organic light-emitting diode display (OLED), after the organic light-emitting unit is formed on the display substrate, the organic light-emitting unit is usually packaged by a thin-film packaging process. When the display panel is subjected to external force, especially when the flexible display panel is bent, it is easy to cause cracks in the encapsulation layer, thereby reducing the ability of the encapsulation layer to prevent water vapor. [0003] In order to detect whether the encapsulation layer is damaged, the current common method is to set a single-layer crack detection (Panel crack detect, PCD) line around the display area. When the resistance of the detection line exceeds the normal range, it means that the detection line is cracked, and then It is deter...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L51/52H01L27/32H01L23/544
CPCH01L22/32H10K59/00H10K50/844
Inventor 张震张祎杨潘康观
Owner BOE TECH GRP CO LTD