Test method for verifying the power-failure protection function of solid-state drives
A technology of power-down protection and solid-state hard disk, applied in the computer field, can solve problems such as system crash, data loss, and data loss, and achieve the effect of simple process, easy implementation, and low time complexity
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0022] see figure 1 A test method for verifying the power-failure protection function of a solid-state hard disk, comprising the steps of obtaining hardware signal verification test data, system function verification test data and reliability verification test data, and judging whether the corresponding test data satisfies preset conditions.
[0023] Wherein, the hardware signal verification test includes the steps of obtaining the power-on and power-on sequence test data of the power-down protection IC and the backup power sequence test data during power-down protection and judging whether the corresponding test data meets the preset conditions; the system function verification test includes A step of acquiring capacitor charging and discharging time data, acquiring capacitor capacity detection data, and judging whether the corresponding test data satisfies a preset condition.
[0024] In this embodiment, a targeted test process is designed according to the characteristics of...
Embodiment 2
[0027] On the basis of Example 1, the reliability verification test includes the steps of obtaining capacitor normal temperature life test data, capacitor low temperature life test data and capacitor high temperature life test data, and judging whether the corresponding test data meets the preset conditions.
[0028] In this embodiment, the specific steps for obtaining the life test data of the capacitor at normal temperature, low temperature and high temperature include:
[0029] A1. The specific steps to obtain the life test data of capacitors at room temperature are as follows:
[0030] At room temperature (25°C), the solid-state drive to be tested is mounted on the server as a slave disk and can be read and written. The firmware of the solid-state drive to be tested needs to have a debugging window output capacitance value. (If the firmware does not support it, remove the capacitor and measure the capacitance). The initial value A of the power-down protection capacitor is...
Embodiment 3
[0036] On the basis of Embodiment 2, in the step of obtaining the power-on and power-off sequence test data of the power-down protection IC, including capturing the power-on signal waveform when the solid-state hard disk is powered on and capturing the power-off when the solid-state hard disk is abnormally powered off signal waveform, and a step of judging whether the signal waveform meets a preset condition.
[0037] In this example,
[0038] B1. The specific steps to capture the power-on signal waveform when the solid-state hard drive is powered on are as follows:
[0039] Install the Linux system on the server, hang the solid-state disk to be tested on the server as a slave disk, and calibrate the deskew between the oscilloscope, the probe and the channel (after the calibration is completed, do not change the settings of the oscilloscope, and do not need to re-calibrate if you do not change the probe), And set the parameters of the oscilloscope, find the point to be tested...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 
