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Test method for verifying the power-failure protection function of solid-state drives

A technology of power-down protection and solid-state hard disk, applied in the computer field, can solve problems such as system crash, data loss, and data loss, and achieve the effect of simple process, easy implementation, and low time complexity

Active Publication Date: 2020-11-10
SHENZHEN TIGO SEMICON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, in the absence of any protective measures for the power supply, if the solid-state hard drive suddenly loses power (that is, the external power supply surges or loses power in an unexpected situation), the data in the cache will be completely lost, and the data will be lost at least , causing the system to crash

Method used

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  • Test method for verifying the power-failure protection function of solid-state drives

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] see figure 1 A test method for verifying the power-failure protection function of a solid-state hard disk, comprising the steps of obtaining hardware signal verification test data, system function verification test data and reliability verification test data, and judging whether the corresponding test data satisfies preset conditions.

[0023] Wherein, the hardware signal verification test includes the steps of obtaining the power-on and power-on sequence test data of the power-down protection IC and the backup power sequence test data during power-down protection and judging whether the corresponding test data meets the preset conditions; the system function verification test includes A step of acquiring capacitor charging and discharging time data, acquiring capacitor capacity detection data, and judging whether the corresponding test data satisfies a preset condition.

[0024] In this embodiment, a targeted test process is designed according to the characteristics of...

Embodiment 2

[0027] On the basis of Example 1, the reliability verification test includes the steps of obtaining capacitor normal temperature life test data, capacitor low temperature life test data and capacitor high temperature life test data, and judging whether the corresponding test data meets the preset conditions.

[0028] In this embodiment, the specific steps for obtaining the life test data of the capacitor at normal temperature, low temperature and high temperature include:

[0029] A1. The specific steps to obtain the life test data of capacitors at room temperature are as follows:

[0030] At room temperature (25°C), the solid-state drive to be tested is mounted on the server as a slave disk and can be read and written. The firmware of the solid-state drive to be tested needs to have a debugging window output capacitance value. (If the firmware does not support it, remove the capacitor and measure the capacitance). The initial value A of the power-down protection capacitor is...

Embodiment 3

[0036] On the basis of Embodiment 2, in the step of obtaining the power-on and power-off sequence test data of the power-down protection IC, including capturing the power-on signal waveform when the solid-state hard disk is powered on and capturing the power-off when the solid-state hard disk is abnormally powered off signal waveform, and a step of judging whether the signal waveform meets a preset condition.

[0037] In this example,

[0038] B1. The specific steps to capture the power-on signal waveform when the solid-state hard drive is powered on are as follows:

[0039] Install the Linux system on the server, hang the solid-state disk to be tested on the server as a slave disk, and calibrate the deskew between the oscilloscope, the probe and the channel (after the calibration is completed, do not change the settings of the oscilloscope, and do not need to re-calibrate if you do not change the probe), And set the parameters of the oscilloscope, find the point to be tested...

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Abstract

The invention provides a testing method for verifying a solid-state hard disk power failure protection function. The testing method comprises the following steps: acquiring hardware signal verification testing data, acquiring system function verification testing data and acquiring reliability verification testing data, and judging whether corresponding testing data meets the preset condition. Thetesting method provided by the invention has the advantages: a method for quickly verifying the solid-state hard disk power failure protection function through multiple verification testing flows is provided, the method is simple in flow, low in time complexity and easy to realize, and especially suitable for the current testing environment with multiple solid-state hard disk testing projects.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a test method for verifying the power-down protection function of a solid-state hard disk. Background technique [0002] In order to improve the read and write performance of the electronic disk, most SSD controllers increase the cache through internal integrated RAM or externally extended RAM. Every time the data in the computer system memory is written to the SSD, it is first written to the cache of the SSD. The SSD controller then writes the data in the cache to the NAND Flash. Therefore, in the absence of any protective measures for the power supply, if the solid-state hard drive suddenly loses power (that is, the external power supply surges or loses power in an unexpected situation), the data in the cache will be completely lost, and the data will be lost at least , which may lead to system crash. [0003] In order to prevent this from happening, it is necessary to add ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 李创锋张威
Owner SHENZHEN TIGO SEMICON