Circuit performance reliability analysis method based on Saber platform modeling and simulation

A technology of analysis method and modeling method, which is applied in the field of circuit performance reliability analysis based on Saber platform modeling and simulation, which can solve the problem that reliability workers cannot provide reliability for designers.

Inactive Publication Date: 2019-01-11
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
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Problems solved by technology

[0005] In view of the above-mentioned deficiencies in the prior art, the circuit performance reliability analysis method based on Saber platform modeling and simulation provided by the present invention solves the problem that it is difficult for reliability workers to provide designers with specific and effective solutions to reliability problems. a problem

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  • Circuit performance reliability analysis method based on Saber platform modeling and simulation
  • Circuit performance reliability analysis method based on Saber platform modeling and simulation
  • Circuit performance reliability analysis method based on Saber platform modeling and simulation

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Embodiment Construction

[0029] The specific embodiments of the present invention are described below so that those skilled in the art can understand the present invention, but it should be clear that the present invention is not limited to the scope of the specific embodiments. For those of ordinary skill in the art, as long as various changes Within the spirit and scope of the present invention defined and determined by the appended claims, these changes are obvious, and all inventions and creations using the concept of the present invention are included in the protection list.

[0030] Such as figure 1 As shown, a circuit performance reliability analysis method based on Saber platform modeling and simulation includes the following steps:

[0031] S1. Taking the circuit system to be analyzed as the object, conduct behavior-level modeling for each electronic component, obtain the electronic component model, and complete the functional simulation verification of each electronic component under the nom...

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Abstract

The invention discloses a circuit performance reliability analysis method based on Saber platform modeling and simulation. Through parameter scanning, the method can analyze the influence of environmental temperature change, storage time increase, and even radiation on the function and performance of the circuit system. The weakness of temperature tolerance, storage tolerance and radiation tolerance design can be found by degradation analysis. The method can analyze the circuit performance degradation under different ambient temperature, and expose the reliability weakness in the circuit design process. The trend of output performance degradation caused by long-time operation or storage can be analyzed, and the time of output performance degradation over-error fault can be given. The method can also provide a basis for avoiding or eliminating radiation effects, and give corresponding design optimization recommendations.

Description

technical field [0001] The invention belongs to the field of circuit reliability analysis, in particular to a circuit performance reliability analysis method based on Saber platform modeling and simulation. Background technique [0002] In engineering, there is a phenomenon that the product circuit reliability design is out of touch with its functional performance design, which seriously restricts the improvement of product reliability and quality. Due to the large number of model projects, heavy tasks, and tight development cycle, product designers have no conditions to systematically carry out reliability design work. Due to the lack of in-depth understanding of products, it is difficult for reliability workers to provide designers with specific and effective solutions to reliability problems. [0003] In the digital platform environment, using modeling and simulation technology, based on unified product design data, it is possible to carry out integrated design of produc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/20G06F30/398
Inventor 黄洪钟曾颖黄土地黄承赓李彦锋郭骏宇余奥迪
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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