Sensitive equipment fault rate calculation method and device

A technology of sensitive equipment and calculation method, which is applied in the field of data communication and can solve the problems of large calculation error and inability to objectively and accurately calculate the failure rate of sensitive equipment.

Inactive Publication Date: 2019-01-29
GUANGDONG POWER GRID CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

It can be seen that the existing calculation methods are subject to the subjective influence of the calculator, and c

Method used

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  • Sensitive equipment fault rate calculation method and device
  • Sensitive equipment fault rate calculation method and device
  • Sensitive equipment fault rate calculation method and device

Examples

Experimental program
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Effect test

Embodiment 1

[0071] see figure 1 , figure 1 It is a schematic flowchart of a calculation method for the failure rate of sensitive equipment provided by an embodiment of the present invention. Among them, such as figure 1 As shown, the calculation method of the failure rate of the sensitive equipment may include the following steps:

[0072] S101. Obtain sample data of a voltage withstand curve corresponding to a sensitive device.

[0073] In this embodiment, a sensitive device is a general term for an object to be disturbed in an electrical system, and may be a small electronic component, a circuit board assembly, a single electrical device, or even a large system. Specifically, sensitive devices can be frequency converters (Variable-frequency Drive, VFD), motors, contactors, adjustable speed drives (adjustable speed drives, ASD), programmable logic controllers (programmable logic controllers, PLC) and personal computers ( personal computer, PC), etc., which is not limited in this embo...

Embodiment 2

[0084] see figure 2 , figure 2 It is a schematic flowchart of a calculation method for the failure rate of sensitive equipment provided by an embodiment of the present invention. Among them, such as figure 2 As shown, the calculation method of the failure rate of the sensitive equipment may include the following steps:

[0085] S201. Obtain sample data of a voltage withstand curve corresponding to a sensitive device.

[0086] S202. Calculate the boundary of the uncertainty region of the voltage withstand curve and the sample value of the severity index according to the sample data.

[0087] In this embodiment, the calculation formula for calculating the boundary of the uncertain region of the voltage withstand curve according to the sample data is:

[0088] u max =max{U 1 , U 2 ,...,U n};

[0089] u min =min{U 1 , U 2 ,...,U n};

[0090] T max =max{T 1 ,T 2 ,...,T n};

[0091] T min =min{T 1 ,T 2 ,...,T n};

[0092] Among them, U min is the upper boun...

Embodiment 3

[0157] see image 3 , image 3 It is a structural schematic diagram of a calculation device for the failure rate of sensitive equipment provided by an embodiment of the present invention. Among them, such as image 3 As shown, the calculation device for the failure rate of the sensitive equipment includes:

[0158] The first acquisition module 301 is configured to acquire sample data of a voltage withstand curve corresponding to sensitive equipment.

[0159] The first calculation module 302 is configured to calculate the probability density function corresponding to the boundary of the uncertain region of the voltage withstand curve and the severity index according to the sample data.

[0160] The second acquiring module 303 is configured to acquire the actual voltage amplitude and the actual duration of the voltage sag when the sensitive device has a voltage sag.

[0161] The second calculation module 304 is configured to calculate the failure rate of the sensitive equipm...

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Abstract

The invention provides a sensitive equipment fault rate calculation method and device. The method comprises the following steps of obtaining sample data of a voltage tolerance curve corresponding to sensitive equipment; calculating an uncertain region boundary of the voltage tolerance curve and a probability density function corresponding to a severity index according to the sample data; obtaininga practical voltage magnitude value and the practical voltage sag duration time when the sensitive equipment generates the voltage sag; and calculating the fault rate of the sensitive equipment afterthe occurrence of the voltage sag according to the practical voltage magnitude value, the practical voltage sag duration time, the probability density function and the uncertain region boundary. By implementing the sensitive equipment fault rate calculation method and device, the fault rate of the sensitive equipment can be objectively calculated; the artificial objective influence is avoided; the calculation accuracy is high; and effective reference can be further provided for timely use of measures to reduce the influence due to the voltage sag.

Description

technical field [0001] The invention relates to the technical field of data communication, in particular to a method and device for calculating the failure rate of sensitive equipment. Background technique [0002] With the improvement of automation in industrial production, more and more sensitive equipment (such as adjustable speed drives, programmable logic controllers, computer equipment, etc.) During operation, if a voltage sag occurs and shuts down these sensitive equipment, it will have a major impact. Therefore, in order to take timely measures to reduce the impact of voltage sag, it is necessary to estimate the failure rate of sensitive equipment. In the existing calculation of the failure rate of sensitive equipment, it is usually first assumed that the voltage tolerance curve obeys a certain probability distribution (such as uniform distribution, normal distribution, exponential distribution, etc.) in the uncertain region according to the sensitivity of the sensi...

Claims

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Application Information

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IPC IPC(8): G01R31/00G06F17/18
CPCG01R31/00G06F17/18
Inventor 罗步升
Owner GUANGDONG POWER GRID CO LTD
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