Frequency measuring method and measuring system thereof

A frequency measurement and frequency technology, applied in the field of frequency measurement methods and measurement systems, can solve problems such as increased cost and slower test response speed, and achieve the effects of increasing measurement accuracy, improving test response speed, and improving sampling accuracy

Inactive Publication Date: 2019-02-01
XIAN INTELLIGENCE SILICON TECH INC
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  • Application Information

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Problems solved by technology

[0004] However, the existing measurement methods and measurement systems generally use a single clock to sample the test signal. To improve the test accuracy, it is necessary to increase the frequency of the sampling clock or increase the sampling time. The increase in the sampling frequency will lead to an increase in cost and sampling time. An increase of will cause the test response to be slower

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  • Frequency measuring method and measuring system thereof
  • Frequency measuring method and measuring system thereof
  • Frequency measuring method and measuring system thereof

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Embodiment Construction

[0037] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0038] See figure 1 , an embodiment of the present invention provides a frequency measurement method, the frequency measurement method comprising:

[0039] Step 1. Obtain N clock signals and sample the test signal at the same time;

[0040] Specifically, N clock signals are generated by the sampling clock module, and the test signal is sampled according to the N clock signals at the same time, wherein the N clock signals have the same frequency and different phases.

[0041] For example, the test signal can be temperature, pressure, flow, liquid level, pH value, vibration, displacement, speed and so on.

[0042] Step 2, obtaining N count values ​​according to the sampled test signal and N clock signals;

[0043] Specifically, an ena...

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Abstract

The invention relates to a frequency measuring method and a measuring system thereof; the frequency measuring method comprises the steps that N clock signals are acquired, and test signals are sampledat the same time, wherein the frequency of the N clock signals is the same, and the phases are different; N counting values are obtained according to the test signals which are obtained through sampling and the N clock signals; and the frequency of the test signals is obtained according to the frequency of the N clock signals and the N counting values. According to the frequency measuring method,the tested signals are sampled at the same time by adopting a set of clock signals with the same frequency and different phases, so that the sampling time is shortened, the sampling precision is improved, and the measurement precision of the frequency is improved.

Description

technical field [0001] The invention relates to the technical field of frequency measurement, in particular to a frequency measurement method and a measurement system thereof. Background technique [0002] With the development of the electronic information industry, the signal is its most basic element, and its frequency measurement plays an increasingly important role in scientific and technological research and practical applications. As the most basic frequency measuring instrument, the digital frequency meter is widely used for its high measurement accuracy, fast speed, easy operation, and digital display. Many physical quantities (such as temperature, pressure, flow, liquid level, PH value, vibration, displacement, speed, etc.) can be converted into signal frequency by sensors and measured by digital frequency meters. Especially the combination of digital frequency meter and microprocessor can realize the multi-function, program control and intelligence of the measurin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/10
CPCG01R23/10
Inventor 田军褚惠芬贾红程显志陈维新韦嶔
Owner XIAN INTELLIGENCE SILICON TECH INC
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