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SV Waveform Comparison Test Method Based on Fast Graph Fitting Algorithm

A test method and graphic technology, applied in the direction of measuring devices, measuring electrical variables, complex mathematical operations, etc., can solve problems such as low precision, large measurement errors, large calculation errors, etc., and achieve the effect of meeting the accuracy requirements

Active Publication Date: 2021-10-22
INTEGRATED ELECTRONICS SYST LAB
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  • Application Information

AI Technical Summary

Problems solved by technology

[0006] At present, the SV waveform comparison method in the industry is: use the zero-crossing point as the starting point, and calculate the effective values ​​of multiple cycles for comparison. However, when the measured sampling value shows a symmetrical sawtooth waveform in this measurement method, the measurement error is relatively large.
There is also a method of calculating the tolerance of the zero-crossing point that can overcome the comparison error problem of the sawtooth waveform, but when the zero drift of the measured sampling value is too large, or the zero point offset is caused by inaccurate timing, the calculation error is also large; use graphic interpolation The method of moving fitting is limited to the selection of moving range, which will bring problems of slow convergence or low precision

Method used

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  • SV Waveform Comparison Test Method Based on Fast Graph Fitting Algorithm
  • SV Waveform Comparison Test Method Based on Fast Graph Fitting Algorithm
  • SV Waveform Comparison Test Method Based on Fast Graph Fitting Algorithm

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Embodiment Construction

[0030] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0031] The core technical solution of the present invention is exactly to realize figure fitting by dichotomy fast interpolation method, as figure 1 Shown is a schematic diagram of the principle of fast interpolation processing by the dichotomy method. Each time the left and right 1 / 2 linear data interpolation is performed on the data queue, and the smaller data queue is selected after comparing the root mean square of the difference, and the larger queue is discarded. figure 1 The bold line in indicates the starting position of the reserved data queue.

[0032] Such as figure 2 Shown is the processing flowchart of SV waveform comparison. In order to solve the error of SV waveform comparison, the first step is to fit the two SV waveforms, and then calculate the root mean square of the difference. Since the two SV waveforms being compared are gener...

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Abstract

The invention relates to a SV waveform comparison test method based on a fast graphic fitting algorithm, which acquires the original graphic data of two SV waveform curves, performs normalization processing on the acquired original graphic data, and calculates the root mean square of the difference And iterate a cycle, perform interpolation, take the smaller one of the two minimum points as the point obtained by interpolation, perform m interpolation calculations, and calculate the root mean square of the difference between the two fitted SV waveforms to obtain the measured merging unit sampling error. The two-way dichotomy fast interpolation method used in the present invention not only satisfies the demand for fast fitting of graphics, but also considers the accuracy. For the waveform sampled at 80 points, the calculation accuracy of 0.244 microseconds can be achieved only through 10 times of interpolation, which can fully meet the measurement accuracy requirements.

Description

technical field [0001] The invention belongs to the technical field of electric power automation, and in particular relates to an SV waveform comparison test method based on a fast graph fitting algorithm. Background technique [0002] As we all know, the power supply standard of China's power system is 50 Hz alternating current, which means that the voltage and current output by the power grid are constantly changing according to the amplitude of the sine wave in a period of 20 milliseconds, which is called the power waveform. In order to monitor the operation status of the power grid, it is necessary to collect the voltage and current in the power grid according to a certain ratio through voltage and current sensors to form simulated power grid status data. With the continuous development of power system equipment, power measurement and control equipment has gradually changed from the original analog acquisition method to digital acquisition method, that is, the voltage an...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R19/25G06F17/17
CPCG01R19/2506G06F17/17
Inventor 瞿晓宏谈凤真周秀丽王菲孟庆媛
Owner INTEGRATED ELECTRONICS SYST LAB
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