SV waveform comparison test method based on fast graphic fitting algorithm
A test method and graphic technology, which is applied in the direction of measuring devices, measuring electrical variables, complex mathematical operations, etc., can solve the problems of low precision, large calculation errors, large measurement errors, etc., and achieve the effect of meeting the accuracy requirements
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[0030] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.
[0031] The core technical solution of the present invention is exactly to realize figure fitting by dichotomy fast interpolation method, as figure 1 Shown is a schematic diagram of the principle of fast interpolation processing by the dichotomy method. Each time the left and right 1 / 2 linear data interpolation is performed on the data queue, and the smaller data queue is selected after comparing the root mean square of the difference, and the larger queue is discarded. figure 1 The bold line in indicates the starting position of the reserved data queue.
[0032] like figure 2 Shown is the processing flowchart of SV waveform comparison. In order to solve the error of SV waveform comparison, the first step is to fit the two SV waveforms, and then calculate the root mean square of the difference. Since the two SV waveforms being compared are generate...
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