Laser gain module key performance testing device

A technology with key performance and laser gain. It is used in measurement devices, optical instrument testing, and machine/structural component testing. It can solve problems such as difficulty in unification and standardization, and achieve the effect of strong versatility, convenient use and compact structure.

Inactive Publication Date: 2019-03-15
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The existing test technology mainly includes testing the gain performance alone, or using different equipment to test the gain distribution, thermally induced bias distribution, and thermally induced wavefront distribution of the laser gain module. There is no device to give detailed thermal bias Testing and analysis methods and steps have complexity and uncertainty in experimental testing, making it difficult to unify and standardize

Method used

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  • Laser gain module key performance testing device
  • Laser gain module key performance testing device
  • Laser gain module key performance testing device

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Embodiment Construction

[0029] The present invention will be further described below in conjunction with the embodiments and accompanying drawings. But it should not limit the protection scope of the present invention.

[0030] see first figure 1 , figure 1 It is a structural schematic diagram of Embodiment 1 of the key performance testing device of the laser gain module of the present invention. It can be seen from the figure that the present invention comprises: the vertical linearly polarized laser pulse sequentially passes through the half-wave plate, the first polarization beam splitter, and the beam expander. The device, the first aperture, the laser gain module to be tested, the first lens, and the first 45-degree half-mirror are divided into three directions according to the test purpose (testing wavefront, gain, or thermal fading): direction one, To test the wavefront distribution, the vertical linearly polarized light pulse passes through the second variable aperture diaphragm, the second...

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Abstract

A laser gain module key performance testing device comprises a half-wave plate, a first polarization beam splitter prism, a beam expander, a first diaphragm, a to-be-tested laser gain module, a firstlens, a first 45-degree full-reflecting lens, a first 45-degree half-reflecting lens, a second variable-aperture diaphragm, a second lens, a wavefront sensor, a third 45-degree full-reflecting lens, athird variable-aperture diaphragm, a third lens, a second 45-degree half-reflecting lens, a third 45-degree full-reflecting lens, a test image sensor and a polarization analysis tester. The testing device can test two-dimensional gain distribution, two-dimensional wavefront distribution and two-dimensional thermal depolarization distribution of the to-be-tested laser gain module. The testing device has the advantages of being comprehensive in performance testing of the laser gain module, high in testing universality, compact in testing device structure and the like.

Description

technical field [0001] The invention relates to the technical field of solid-state laser amplification, in particular to a key performance testing technology of a laser gain module. Background technique [0002] With the development of solid-state laser technology, laser systems need to achieve laser pulse output with high energy, high power, and high beam quality. The laser gain module is the key module unit that affects the beam quality. The performance of the key module is comprehensively and systematically tested, which plays a key role in supporting the overall laser system performance control. [0003] The solid-state laser system gain medium mainly includes a transmissive rod-shaped or flake solid structure, and a reflective one. Here, we mainly focus on the transmissive solid gain medium. The two-dimensional gain distribution of the laser gain module is the main factor affecting the near-field of the beam. Detailed testing of the two-dimensional gain distribution of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/00
CPCG01M11/00
Inventor 王江峰郭江涛卢兴华夏刚王小琴李学春
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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