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Backlight panel defect detection system and method based on multi-angle shooting

A defect detection, multi-angle technology, used in optical testing flaws/defects, measuring devices, material analysis by optical means, etc., can solve the problems of misjudgment of test results, failure to be observed, and single sample of pictures taken.

Active Publication Date: 2021-09-10
WUHAN JINGLI ELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This backlight panel defect detection method can only detect the two types of defects, such as dirty foreign matter and white spots, and cannot be observed for damage types such as scratches, scratches and dander.
[0004] Secondly, due to the weak uneven brightness of the backlight panel itself (this part will not be judged as a defect) and the noise problem of the front-facing camera, there may be subtle noise in the picture taken by the front-facing camera. Under the condition of ensuring a low missed detection rate , these noise points will lead to a large number of over-detection problems, which will lead to misjudgment of the detection results and reduce production efficiency
This is due to the single-camera imaging and the single sample of the picture taken, which cannot be compared.

Method used

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  • Backlight panel defect detection system and method based on multi-angle shooting
  • Backlight panel defect detection system and method based on multi-angle shooting

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Embodiment Construction

[0017] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0018] General dirt and foreign matter, attached to each film layer of the backlight panel, will generally appear as black spots or black spots in the front view direction due to affecting the transmittance of the backlight. As for the white spot, it is due to the damage of a certain film layer or the uneven thickness, which causes the brightness of the tiny area to shine, which can also be observed through the front view. For the damage type defects such as scratches and scratches, the transmittance will not be affected, so it is generally difficult to observe in the front view of the camera. As for the scratched area, due to the law of refraction and reflection of light, this kind of light will generally be reflected to the side viewing angle, so it can be well detected when viewed from the side. For dander defects, such defects will exist in...

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Abstract

The invention discloses a backlight panel defect detection system based on multi-angle shooting, which includes a front-view camera and an image processor. The front-view camera is used to take a front-view defect detection image of the entire backlight panel. The high-position side-view camera is used to capture the defect detection image of the upper half of the backlight panel. The defect detection image of the upper half is the defect detection image from the top edge to the center of the backlight panel. The defect detection image in the lower half area is the defect detection image from the center area to the bottom edge of the backlight panel; the present invention can perform defect target detection with low missed detection rate and low over detection rate.

Description

technical field [0001] The invention relates to the technical field of automatic defect detection of display panels, in particular to a defect detection system and method for backlight panels based on multi-angle shooting. Background technique [0002] In the defect detection of AOI (Automatic Optic Inspection, automatic optical inspection) backlight panel, it is very important to judge the defect level of the panel such as dirty foreign matter, white spots, scratches, scratches and lint, which is the most basic detection content. The surface defect detection results of AOI backlight panels directly affect the final grade judgment results of backlight panels. The traditional classification of surface defects is based on the observation of backlight defects by human eyes. The process of human eye detection is highly subjective and greatly affected by individual factors, which directly leads to unstable detection efficiency. At the same time, with the extension of working hou...

Claims

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Application Information

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IPC IPC(8): G01N21/88
CPCG01N21/8851G01N2021/8887
Inventor 洪志坤张胜森欧昌东郑增强
Owner WUHAN JINGLI ELECTRONICS TECH