Special computing device for electrical tests

Abstract

The invention discloses a special computing device for electrical tests. The special computing device comprises a display module, an operating module, a storage module and a microcontroller module. The display module and the operating module are arranged on the surface of a shell, the storage module and the microcontroller module are arranged in the shell, an output end of the operating module iselectrically connected with an input end of the microcontroller module, an output end of the microcontroller module is electrically connected with an input end of the display module, and the microcontroller module and the storage module are connected through an expansion interface. A direct-current resistance temperature conversion module, a transformer direct-current resistance unbalance rate computing module, a phase line resistance value conversion module, a line phase resistance value conversion module, an insulation resistance temperature conversion module and a dielectric loss factor temperature conversion module are loaded on the microcontroller module. The special computing device is capable of quickly processing electrical test onsite computing and conversion and clearly judging whether test results accord with regulation requirements or not.

Description

technical field [0001] The invention relates to a special computing device for electrical tests, which belongs to the field of computing tools. Background technique [0002] All kinds of primary equipment in substations need to carry out various electrical tests, and many of the test items need to be calculated and converted before they can be compared with various current national standards and industry standards to draw test conclusions. [0003] These calculations and conversions have a large amount of data and are highly repeatable. For example, calculating the winding direct resistance unbalance rate of a 220kV transformer requires 19 identical calculations. These data processing processes take up a lot of time of the testers and seriously affect the speed of the test. If the overdue power transmission is caused, unnecessary losses will be caused to the company and users. In some cases, due to the influence of power transmission time, the testers have to roughly estim...

AI Technical Summary

Problems solved by technology

These data processing processes take up a lot of time for the testers and seriously affect the speed of the test. If it causes overdue power transmission, it will cause unnecessary losses to the company and users

In some cases, due to the influence of power transmission time, the testers have to roughly estimate the test results based on experience. After the test is over, they can accurately calculate whether the data meets the requirements of the regulations, which will bring huge benefits to the safe and stable operation of the power grid. Hidden dangers

[0004] The traditional method requires testers to use calculators to calculate with paper and pen, and the existing calculators have complex functions and large volumes, which are not suitable for electrical test work sites

Images