Tunneling Field Effect Transistor

A tunneling field effect, transistor technology, applied in semiconductor devices, electrical components, circuits, etc., can solve problems such as inability to achieve, reduce power consumption, etc., to increase on-state current, reduce tunneling distance, and increase energy band. The effect of overlapping areas

Active Publication Date: 2022-03-11
NANTONG UNIVERSITY
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] With the continuous shrinking of the feature size of semiconductor devices, Metal Oxide Semiconductor Field Effect Transistor (MOSFET) devices are limited by the sub-threshold swing limit (60mV / dec), high off-state current, short channel effect, etc., reducing the operating voltage will Cannot achieve the effect of reducing power consumption

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Embodiment Construction

[0017] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. Typical embodiments of the invention are shown in the drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of the present invention will be thorough and complete.

[0018] It should be noted that when an element is referred to as being “fixed” to another element, it can be directly on the other element or there can also be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or intervening elements may also be present. The terms "left", "right" and similar expressions are used herein for the purpose of illustration only.

[0019] Unless otherwise defined, all technical...

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Abstract

The invention discloses a tunneling field effect transistor, comprising: a source region, a channel region and a drain region connected between a gate electrode, a source electrode and a drain electrode; the source region and the drain region are surrounded by a channel region isolated, the source electrode is an ohmic contact electrode and forms an ohmic contact with the source region, and the drain electrode is an ohmic contact electrode and forms an ohmic contact with the drain region; wherein, the transistor also includes a first Schottky electrode of a floating metal material, so The first Schottky electrode forms a Schottky contact with the source region, and the first Schottky electrode is arranged at a position close to the contact surface between the source region and the channel region. In the conventional A new source electrode structure consisting of a Schottky electrode and a source electrode is designed on the basis of the TFET device. The floating Schottky contact electrode of a high work function metal material can effectively lift the energy band under the Schottky contact electrode. , increase the energy band overlap between the valence band of the source region and the conduction band of the channel region, reduce the tunneling distance, and increase the on-state current.

Description

technical field [0001] The invention relates to the field of semiconductor devices, in particular to a tunneling field effect transistor. Background technique [0002] With the continuous shrinking of the feature size of semiconductor devices, Metal Oxide Semiconductor Field Effect Transistor (MOSFET) devices are limited by the sub-threshold swing limit (60mV / dec), high off-state current, short channel effect, etc., reducing the operating voltage will The effect of reducing power consumption cannot be achieved. Since the tunneling field-effect transistor (Tunneling field-effect transistor, TFET) works on the physical mechanism of band-band tunneling, it has lower sub-threshold swing and off-state current, so it is regarded as the most suitable nanoscale MOSFET. One of the strong contenders. However, the low on-state current of TFET greatly limits its application, so how to increase the on-state current of TFET is an urgent problem to be solved. [0003] At present, in ord...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/739H01L29/417H01L29/47
CPCH01L29/41725H01L29/47H01L29/7391
Inventor 施敏柯亚威张威朱友华
Owner NANTONG UNIVERSITY
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