Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Ring laser electrode indium seal quality detecting method and system

A ring laser and detection system technology, applied in the direction of testing optical performance, etc., can solve problems such as affecting imaging quality, and achieve the effect of eliminating reflected stray light, increasing contrast and imaging quality, and realizing detection.

Pending Publication Date: 2019-04-05
HUAZHONG PHOTOELECTRIC TECH INST (CHINA SHIPBUILDING IND CORP THE NO 717 INST)
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Aiming at the problem that the reflected stray light of the cavity glass in the ring laser will enter the imaging system and affect the imaging quality during the quality detection process of the electrode indium seal, the invention provides a ring laser electrode indium seal quality that can increase the contrast of the detection target and improve the imaging quality Detection Systems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Ring laser electrode indium seal quality detecting method and system
  • Ring laser electrode indium seal quality detecting method and system
  • Ring laser electrode indium seal quality detecting method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0029] Such as figure 1 , 2 As shown, a ring laser electrode indium sealing quality inspection system of the present invention includes a linearly polarized light source 1 and a polarized light imaging mechanism 4, and the linearly polarized light source 1 includes a common light source 11, a parabolic reflector 12, ground glass 13 and a polarizer 14 , the natural light emitted by the ordinary light source 11 is collimated by the parabolic reflector 12 and then incident on the frosted glass 13 to scatter and homogenize the light, and then enter the polarizer 14 to be converted into linearly polari...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a ring laser electrode indium seal quality detecting method and system. The system comprises a linearly polarized light source and a polarized light imaging mechanism, linearlypolarized light generated by the linearly polarized light source is obliquely incident into a glass cavity to be irradiated to an interface of the glass cavity and an indium ring, mixed reflected light is formed, the mixed reflected light is imaged by a polarized light imaging mechanism, a polarized light imaging system includes a quarter wave plate, an polarization analyzer and an industrial CCDcamera, and the quarter wave plate and the polarization analyzer can effectively filter the reflected light generated by the glass cavity and only allow the reflected light in an indium ring region to be imaged. The ring laser electrode indium seal quality detecting system eliminates the stray reflected light on the surface of the glass cavity, increases the contrast of imaging of the indium ring, makes the sealing connecting defects be easier to observe, and improves the indium ring detection quality.

Description

technical field [0001] The invention relates to the field of ring laser manufacturing, in particular to a technology for detecting the quality of ring laser electrode indium seals. Background technique [0002] Ring lasers are standard light sources widely used in high-precision optical metrology instruments, such as laser gyroscopes. The laser gyroscope is a high-precision photoelectric inertial sensing element that has achieved fruitful practical applications in the field of inertial technology, and is widely used in inertial navigation systems on aircraft, rockets and tanks. [0003] Ring lasers usually use quartz glass or glass-ceramic as the resonant cavity of the laser. The cavity is drilled with a light-through hole, and the reflector and the cavity are airtightly mounted at the vertices of the polygon by optical glue to form a polygonal closed-loop optical path. A cathode and two anodes are installed on the cavity, using the clear hole in the cavity as a laser gain...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 刘文明郭岩龙王鹏杨长城李林军陈超人
Owner HUAZHONG PHOTOELECTRIC TECH INST (CHINA SHIPBUILDING IND CORP THE NO 717 INST)
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com