Calculation Method of Complex Permittivity of Microwave Materials under High Temperature and Broad Frequency

Abstract

The embodiment of the invention provides a method for calculating the complex dielectric constant of a microwave material under high temperature and wide frequency. The method comprises the followingsteps: S1, acquiring microwave test data in the range of test temperature and test frequency, and calculating the forward two-port impedance of a microstrip line covered with a thermal insulation cushion structure by a forward transmission reflection method based on microwave test data and a microstrip line two-port network covered with the thermal insulation cushion structure; S2, resolving the inverted two-port impedance of the microstrip line covered with the thermal insulation cushion structure by a variational capacitance method; and S3, resolving the complex dielectric constant of a microwave material to be tested in the range of test temperature and test frequency based on the equivalent relationship between the forward two-port impedance and the reverse two-port impedance of the microstrip line covered with the thermal insulation cushion layer. Through the method in the embodiment of the invention, the complex dielectric constant of the microwave material under high temperatureand wide frequency conditions can be calculated accurately, and reliable data support is provided for the application of the high temperature and wide frequency microwave material.

Description

technical field [0001] The invention relates to the technical field of microwave testing, in particular to a method for calculating the complex dielectric constant of microwave materials at high temperature and wide frequency. Background technique [0002] With the rapid development of science and technology and communication technology, microwave materials have been widely used in many fields such as radar navigation, aerospace, microwave communication, national defense and military industry, electronic technology and new materials. However, in the process of using the dielectric material, the temperature of the dielectric material rises and the frequency band of the surrounding environment changes. The increase of temperature and the change of the ambient frequency band will bring about the change of the complex dielectric constant of the dielectric material, and further affect the accuracy of the test results. Therefore, it is particularly important to accurately and eff...

AI Technical Summary

Problems solved by technology

Then the traditional microstrip line method for measuring the complex dielectric constant will no longer be applicable, which will lead to large deviations in the calculation results and even serious errors.

Images