Test method

Abstract

The invention relates to a test method, comprising the following steps of: adjusting a plurality of infrared ranging devices to be tested into a trigger test mode; operating a multi-machine test device along the set test path under a power system. triggering the corresponding infrared ranging device by the central control system for ranging according to the set test interval and the set test sequence; sending all of the test distances of each infrared distance measuring device and the real distances corresponding to the test distances by the central control system to the host computer; determining whether a plurality of infrared ranging devices to be tested is qualified by the host computer according to the received data. The qualified infrared distance measuring device enters the next process as a qualified product, and the unqualified infrared distance measuring device is calibrated by the host computer through data modeling and algorithm analysis. According to the test method, the test device can test a plurality of infrared ranging devices at one time due to the setting that the plurality of infrared ranging devices to be tested is sequentially triggered to be tested at a set test interval under the control of the central control system, improving the efficiency of the test, and making the test data more accurate.

Description

Technical field [0001] The invention relates to the technical field of laser radar equipment, in particular to a testing method. Background technique [0002] Optical scanning distance measurement device is a device that uses collimated beams to perform non-contact scanning distance measurement through Time of Flight (TOF), triangulation and other methods. At present, the usual optical scanning ranging device includes: a light emitting module, an optical lens, and a chip that receives and processes signals. The light emitting module emits a light beam, and the optical lens is located on the light path of the light emitting module. The collimated light beam is emitted to the surface of the object to be measured. After encountering obstacles, the light beam is reflected on the receiving chip, and the receiving chip transmits to the receiving area through measurement The distance between the measured object and the device can be obtained by knowing the time, phase difference and th...

AI Technical Summary

Problems solved by technology

[0004] The object of the present invention is to propose a test trolley, through a plurality of infrared distance measuring devices to be tested under the control of the central control system to sequentially trigger the test setting according to the set test interval, solving the problem that the prior art can only test one at a time platform problems, greatly improving the test efficiency of the test device

[0006] One of the objectives of the present invention is to propose a testing method, which integrates testing, position verification and calibration of the infrared distance measuring device to be tested through the testing method of multi-machine simultaneous testing, and solves the problem of low test efficiency in the prior art The problem

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