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Semiconductor junction temperature calculation method, device, computer equipment and storage medium

A computing method and semiconductor technology, applied in the direction of single semiconductor device testing, material thermal development, etc., can solve problems such as complex architecture and inability to pre-estimate semiconductor junction temperature conditions, reduce failure rates, simplify hardware implementation architecture and computing methods Effect

Active Publication Date: 2021-05-18
SHANGHAI UNITED IMAGING HEALTHCARE
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the current traditional technology has a complex architecture and cannot predict the actual semiconductor junction temperature in advance.

Method used

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  • Semiconductor junction temperature calculation method, device, computer equipment and storage medium
  • Semiconductor junction temperature calculation method, device, computer equipment and storage medium
  • Semiconductor junction temperature calculation method, device, computer equipment and storage medium

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Embodiment Construction

[0024] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0025] Power semiconductor devices are the key devices of high-power electronic components and systems. When power semiconductor devices are working, their junction temperature will directly affect the reliability and stability of power semiconductor devices and the system where power semiconductor devices are located. The traditional calculation method of semiconductor junction temperature needs to collect electrical parameters such as voltage and current during operation in real time, and the implementation structure is relatively complicated. In this embodiment, the con...

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Abstract

The present application relates to a semiconductor junction temperature calculation method, device, computer equipment and storage medium. The method includes: obtaining control instructions transmitted to semiconductor components; inputting the control instructions into a power loss model to obtain loss data; inputting the loss data into a junction temperature model to obtain semiconductor junction temperatures. It avoids the collection of electrical parameters such as voltage and current during work, simplifies the hardware implementation architecture and calculation method, and can predict the junction temperature during actual work according to the control instructions, and provide early warnings for abnormal conditions, reducing the failure of semiconductor components and systems Rate.

Description

technical field [0001] The present application relates to the technical field of electrical parameter measurement, in particular to a semiconductor junction temperature calculation method, device, computer equipment and storage medium. Background technique [0002] A semiconductor device is an electronic device whose conductivity is between a good conductor and an insulator, and uses the special electrical characteristics of semiconductor materials to complete specific functions. For example: used to generate, control, receive, transform, amplify signals, and perform energy conversion. Semiconductor junction temperature is the actual operating temperature of a semiconductor device. Power semiconductor devices are key devices in high-power electronic components and systems. The semiconductor junction temperature during operation directly affects the reliability and stability of semiconductor devices and systems. [0003] In the current traditional technology, the calculatio...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01N25/20
Inventor 褚旭陈基锋张晗朱卉
Owner SHANGHAI UNITED IMAGING HEALTHCARE