Three-dimensional measuring device, three-dimensional measuring method and storage medium
A technology of three-dimensional measurement and three-dimensional position, which is applied in the field of three-dimensional measurement, can solve problems such as the difficulty of detecting three-dimensional position accumulation, and achieve the effect of high definition
Active Publication Date: 2020-12-11
ORMON CORP
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Problems solved by technology
[0007] However, in the three-dimensional measurement method using the stereo method, since the measurement accuracy is directly affected by the texture (texture) of the surface of the object to be measured, the detection of corresponding points or the three-dimensional position on a flat surface or reflective surface with little texture It is very difficult to accumulate
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[0058] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. The three-dimensional measurement system according to the present embodiment shoots the object to be measured by projecting patterned light, and measures the three-dimensional shape of the object to be measured using the principle of triangulation. In addition, the same code|symbol is attached|subjected to the same element, and repeated description is abbreviate|omitted. In addition, the following embodiment is an example for demonstrating this invention, and it does not intend that this invention is limited only to this embodiment. Moreover, various deformation|transformation can be implemented in this invention unless it deviates from the summary.
[0059] A. This embodiment
[0060] [constitute]
[0061] figure 1 It is a figure which shows the structure of the three-dimensional measurement system 1000 which concerns on this embodiment.
[0062] The conf...
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The invention provides a three-dimensional measuring device, a three-dimensional measuring method and a storage medium, and the reproducibility and image definition of the three-dimensional point group data of the measuring object are higher than those of the prior art. Three-dimensional measurement is performed by projecting patterned light having a mixed pattern (Ph) on the measurement object. The mixed pattern (Ph) is a pattern formed by superimposing the irregular pattern (Pr) on the structured light pattern (Ps), and the pattern is arranged so that the irregular pattern (Pr) and the structured light pattern (Ps) do not interfere with each other. Thereby, it is possible to enjoy both advantages of a structured light pattern excellent in image clarity and an irregular pattern excellent in reproducibility of three-dimensional point cloud data.
Description
technical field [0001] The present invention relates to a three-dimensional measurement technique for measuring a three-dimensional position of a measurement object by projecting pattern light. Background technique [0002] Active measurement is known as a method of measuring the three-dimensional shape of an object. In active measurement, an image is taken with patterned light projected on the object to be measured, and the three-dimensional shape of the object to be measured (three-dimensional position of each pixel) is obtained from the position of the pattern on the imaged image using the principle of triangulation . [0003] Among active measurements, one-shot active shape measurement capable of measuring a three-dimensional shape using only one image has attracted attention as a useful technique because real-time measurement is possible using only one image. [0004] As a method of performing a single active shape measurement, a method using a structured light patter...
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IPC IPC(8): G01B11/25
CPCG01B11/2513G01B11/2545G06T7/521G06T7/593G06T7/74
Inventor 付星斗诹访正树
Owner ORMON CORP