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In-situ device for measuring surface thermal stress of thermal barrier coating system

A technology of thermal barrier coating and thermal stress, which is applied in measuring devices, using stable tension/pressure to test material strength, material thermal analysis, etc., can solve problems such as complex service environment and difficult stress measurement, and achieve simple device structure , the effect of convenient operation

Active Publication Date: 2019-05-17
BEIJING UNIV OF TECH
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  • Summary
  • Abstract
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  • Application Information

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Problems solved by technology

Finally, the service environment of thermal barrier coatings is extremely complex, and many factors such as high-temperature radiation, airflow disturbance, and oxidation sintering need to be overcome, which brings great difficulties to the measurement of stress. The mechanical properties are not the same, which puts forward higher requirements for thermal stress detection of thermal barrier coating films

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  • In-situ device for measuring surface thermal stress of thermal barrier coating system
  • In-situ device for measuring surface thermal stress of thermal barrier coating system

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Embodiment

[0018] An in-situ device for measuring the thermal stress on the surface of a thermal barrier coating system, which ensures that the temperature of the thermal barrier coating system can be changed during the thermal stress measurement experiment, and the thermal stress during the heating-heating-cooling process of the sample can be detected without damage . The device includes a stress measuring instrument (101), a substrate (102), an adhesive layer (103), an aluminum oxide film (104), a ceramic layer (105), a heating plate (106) and a fixing plate (107).

[0019] The substrate (102), the bonding layer (103), the aluminum oxide film (104), the ceramic layer (105), and the heating plate (106) are arranged on the fixing plate (107) from inside to outside;

[0020] The stress measuring instrument (101) exists independently above the substrate (102); the outer wall of the substrate (102) is sprayed to form a bonding layer (103); the surface of the bonding layer (103) is sputtered...

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Abstract

The invention discloses an in-situ device for measuring the surface thermal stress of a thermal barrier coating system. The device comprises a stress measuring instrument (101), a base (102), a bonding layer (103), an aluminium oxide film (104), a ceramic layer (105), a heating plate (106) and a fixing plate (107). By means of the device, the temperature of the thermal barrier coating system can be changed in a thermal stress measurement experimental process; the thermal stress of a sample is detected without damage in temperature increasing, keeping and decreasing processes; and the device issimple in structure and convenient to operate.

Description

technical field [0001] The invention relates to an in-situ device for measuring the thermal stress on the surface of a thermal barrier coating system. The device ensures that the temperature of the thermal barrier coating system can be changed during the thermal stress measurement experiment, and the non-damage detection pattern is heated-keep-cooled The thermal stress in the process belongs to the technical field of sample mechanical property experiment. Background technique [0002] Since the thermal barrier coating is a typical multilayer structure system, firstly, the material parameters (thermal expansion coefficient, elastic modulus and thermal conductivity) of each layer do not match, according to Fourier’s law and thermal diffusion equation, the internal There is a temperature difference, and due to external constraints and mutual constraints between internal layers, it cannot completely expand and contract and generate thermal stress. Secondly, the thickness of eac...

Claims

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Application Information

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IPC IPC(8): G01N3/18G01N25/00
Inventor 雷钧刘世庚徐艳洁刘慧付豪
Owner BEIJING UNIV OF TECH
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