The invention discloses a chip and an apparatus for high-flux testing gas-phase photoelectric properties of a semiconductor. The chip comprises an alumina ceramic substrate which is disposed at the bottom of the chip, electrode arrays and electrode pins which are respectively printed on a surface and two sides of the substrate by a screen printing method, and semiconductor photoelectric materials which are printed on each electrode through an ink-jet printing method or the screen printing method. The apparatus comprises a closed testing cavity and an LED light source. A lug boss for placing the chip is mounted on a base plate, and reeds are in a compression-type contact with the electrode pins of the chip. An integrated level of the electrode arrays on the chip can be changed according to different requirements, and has strong expansibility. Various testing conditions of the apparatus, such as wavelengths of the light source, intensity of the light source, atmosphere, humidity, bias voltage, and the like, can be changed conveniently, so that abundant testing results can be obtained and perfect databases can be established. Moreover, the apparatus is simple in structure and small in size, and has good reliability. The chip and the apparatus have important applications in the fields of room temperature gas-sensitive sensors, optical detections, photocatalysis, etc.