Machine vision light source uniformity evaluation device and method

Abstract

The application discloses a machine vision light source uniformity evaluation device and method, wherein the machine vision light source uniformity evaluation device includes: a machine vision imaging system, a dodging sheet, and a processor connected to the machine vision imaging system; It is set at the position of the sample to be detected by the machine vision system, and is projected by the light generated by the light source to be tested; the angle between the axis of the machine vision imaging system and the dodging sheet is θ, so that the machine vision imaging system can be used for uniformity The light sheet performs imaging and collects images; the processor is used to receive the images, calculate and analyze the images, obtain the gray uniformity of the images, and determine the illuminance uniformity of the light source to be tested according to the gray uniformity of the images. By adopting the embodiment of the present application, without increasing the system space, the light source to be measured can be scattered through the dodging sheet, the image of the dodging sheet can be collected, the uniformity of the image can be determined through image processing, and the uniformity of the light source to be measured can be determined to improve the efficiency.

Description

technical field [0001] The present application relates to the field of machine vision, in particular to a device and method for evaluating the uniformity of a machine vision light source. Background technique [0002] With the gradual development of industrial automation and artificial intelligence, machine vision plays an increasingly important role, and the uniform illumination of the light source to be tested plays a key role in machine vision inspection. In the machine vision system, the measured object is imaged on the camera through the lens. The detection accuracy of the system is closely related to the imaging quality, and the lighting of the object directly affects the imaging quality. Focus on the development of light sources to be tested, and the uniformity of these light sources to be tested is one of the core indicators for evaluating the performance of light sources to be tested. [0003] Generally, to detect the uniformity of the light source to be tested, we...

AI Technical Summary

Problems solved by technology

[0003] Generally, to detect the uniformity of the light source to be tested, we use a luminance meter or an integrating sphere to measure point by point. Only the light intensity of a small area can be collected each time. The measurement efficiency is very low, and it is limited by the measurement space.

In the detection of the back-to-be-tested light source, it is gradually improved to use charge-coupled device (CCD) imaging to detect the uniformity of the back-to-be-tested light source, but in the detection of ordinary point light sources and line light sources, it cannot be used CCD images it directly to judge its uniformity

Especially in the machine vision measurement system, the measurement system is generally set on the assembly line or packaged in an instrument, and the size and space are greatly limited.

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