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How to measure capacitance

A measurement method and capacitance value technology, which is applied in the direction of measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problems of excessive response time gap of comparators, measurement errors, etc., and achieve the effect of accurate calculation

Active Publication Date: 2021-04-30
HOLTEK SEMICON
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In view of the above problems, the present invention provides a method for measuring the capacitance value to solve the problem of the large gap in the response time of the comparator and the measurement error caused by the parasitic capacitance, so as to more accurately measure the capacitance value of the capacitance to be measured

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  • How to measure capacitance
  • How to measure capacitance
  • How to measure capacitance

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Embodiment Construction

[0113] figure 1 is a schematic diagram of the structure of the first embodiment of the measurement system of the present invention. figure 2 It is a flow chart of the first embodiment of the measurement method of the capacitance value of the present invention. Figure 3A yes figure 1 The structural diagram of the first parallel structure formed by the measurement system in the first operating state.

[0114] see figure 1 , the measuring system 10 includes: a reference capacitor 11 , a capacitor under test 12 , a comparator 14 , a reference switch 15 , a switch under test 16 and a virtual switch 17 . The reference switch 15 is connected between the reference capacitor 11 and the comparator 14 . The switch under test 16 is connected between the capacitor under test 12 and the comparator 14 . The dummy switch 17 is connected between the floating node N1 and the comparator 14 .

[0115]Herein, the measurement system 10 also includes a parasitic capacitance (hereinafter refe...

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Abstract

A method for measuring a capacitance value, comprising: controlling a reference switch, a virtual connection switch, and a switch to be tested to form a reference capacitance (C REF ), virtual capacitance, capacitance to be measured, the first parasitic capacitance corresponding to the reference capacitance, the second parasitic capacitance corresponding to the capacitance to be measured, and the stray capacitance of the comparator connected in parallel to the three parallel architectures of the detection node, detection in various parallel architectures The action time (T1, T2, T3) of the node voltage of the lower detection node, and the capacitance value (C MEAS ).

Description

technical field [0001] A measuring method, in particular to a measuring method of capacitance value. Background technique [0002] Traditionally, the measurement system measures the capacitance or resistance value by using the principle that the charging or discharging time of the resistance-capacitance (RC) circuit of the measurement system has a linear relationship with the capacitance. Here, the measurement system uses a counter or TDC (Time-to-Digital Converter, time-to-digital conversion unit) to record the charging or discharging time and convert it into a digital signal, and then calculate the desired value based on the digital signal through the linear relationship between the charging or discharging time and the capacitance. The measured capacitance or resistance value. [0003] However, in a traditional measurement system, both the capacitance to be measured and the reference capacitance are affected by an IC (integrated circuit, integrated circuit) package or an ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/26
Inventor 陈议诚
Owner HOLTEK SEMICON