Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

X-ray copper foil coating thickness measuring instrument

An X-ray and thickness gauge technology, applied in the field of X-ray copper foil coating thickness gauge, can solve the problems of low measurement accuracy, achieve high-precision measurement, improve measurement accuracy, and good heat dissipation performance

Pending Publication Date: 2019-05-28
MAANSHAN HENGRUI MEASURE EQUIP
View PDF11 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing X-ray thickness gauges have low measurement accuracy and need to be improved

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • X-ray copper foil coating thickness measuring instrument
  • X-ray copper foil coating thickness measuring instrument
  • X-ray copper foil coating thickness measuring instrument

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0020] see Figure 1-5 , the present invention provides a technical solution: an X-ray copper foil coating thickness gauge, including a thickness measuring mechanism and a control cabinet 1, the thickness measuring mechanism includes a fixed bracket, and the fixed bracket includes an upper beam 2, a column 3 and the base 4, the column 3 is vertically installed on one side of the base 4, the upper beam 2 is vertically installed on the top of the column 3, and t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an X-ray copper foil coating thickness measuring instrument. The thickness measuring instrument includes several thickness measuring mechanisms and a control cabinet. Each thickness measuring mechanism comprises a fixed support, each fixed support includes an upper cross beam, a stand column and a base, each stand column is vertically installed on one side of the corresponding base, the upper cross beams are vertically installed at the tops of the stand columns, the upper cross beams are parallel to the bases, and the upper cross beams, the stand columns and the bases are connected to form a C-shaped structure, the bottoms of the bases are provided with buffer bases, the bottoms of the buffer bases are provided with pulleys matched with sliding rails, upper slidingrails are arranged on the inner sides of the upper cross beams, lower sliding rails are arranged on the inner sides of the bases, X-ray sources are slidably connected with the upper sliding rails, thelower sliding rails are slidably connected with detectors symmetrical to the X-ray sources, and the thickness measuring mechanisms are connected with the control cabinet. The structure design is novel, thickness measuring mechanisms can be achieved, the instrument has strong operational stability, multi-point measurement of products can be achieved through the thickness measuring mechanisms and the cost is saved.

Description

technical field [0001] The invention relates to the technical field of coating thickness gauges, in particular to an X-ray copper foil coating thickness gauge. Background technique [0002] A thickness gauge is an instrument used to measure the thickness of materials and objects. In industrial production, it is often used to continuously or sample the thickness of products (such as steel plates, steel strips, films, paper, metal foils, etc.). Among these instruments are radioactive thickness gauges that utilize the penetrating characteristics of α-rays, β-rays, and γ-rays; ultrasonic thickness gauges that use ultrasonic frequency changes; eddy current thickness gauges that use the principle of eddy current; and mechanical contact measurement principles. thickness gauge etc. [0003] X-ray thickness gauge is widely used in online thickness measurement of ultra-thin copper strip (above 8um) and its associated production lines. The existing X-ray thickness gauges have low me...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B15/02
Inventor 朱卫民李蔚森
Owner MAANSHAN HENGRUI MEASURE EQUIP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com