Method and device for calibrating polarization aberration of Muller microscope
A calibration method and aberration technology, which is applied in the direction of microscope, measuring device, machine/structural component testing, etc., can solve problems such as unconsidered, information loss, and measurement accuracy dependent on the manufacturing accuracy of polarizing devices, so as to ensure measurement accuracy and stability sexual effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0024] The following embodiments of the present invention use the eigenvalue calibration method to realize the measurement and calibration of the Mueller matrix. We will see that the calibration method has the following advantages by the following description: (1) use a variety of Mueller matrix known standards Samples are used to fully model and calibrate the polarizer and analyzer modules, so there is no modeling error. (2) Error factors such as the initial position of the polarization device, the manufacturing error of the polarization device, and the polarization aberration of the system have all been included in the system model and calibrated through the calibration algorithm, so the requirements for system optical path adjustment and device selection are reduced. (3) Through the perfection of the system model and algorithm correction, the polarization aberration can be effectively overcome.
[0025] The following describes the embodiment in detail in several aspects.
...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


