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Method and device for calibrating polarization aberration of Muller microscope

A calibration method and aberration technology, which is applied in the direction of microscope, measuring device, machine/structural component testing, etc., can solve problems such as unconsidered, information loss, and measurement accuracy dependent on the manufacturing accuracy of polarizing devices, so as to ensure measurement accuracy and stability sexual effect

Active Publication Date: 2021-08-24
SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV
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Problems solved by technology

There are some disadvantages in the process of using the device to measure the Mueller matrix of the sample: (1) The measurement accuracy of the Mueller matrix depends on the manufacturing accuracy of the polarizing device, there are transmittance and extinction ratio from the polarizer and the transmittance of the wave plate System error caused by unsatisfactory parameters
(2) If the precise adjustment of the optical path cannot be realized, there will be systematic errors in the measurement results due to the inaccurate initial position of the polarization device
(3) The accuracy of polarization modulation depends on the precise control of the direction of the fast axis of the wave plate, so there are still measurement errors in the measurement results due to the control error of the fast axis direction of the wave plate
[0004] The data processing method in the Muller microscopic imaging equipment is the Fourier transform method, and there is also a calibration algorithm based on this data processing method to reduce the errors caused by the above shortcomings, but this calibration algorithm also has defects, including information loss , secondary error transfer, limited initial position of the polarizing device, and the calibration algorithm does not consider the influence of the condenser and objective lens in the microscope system, making the algorithm system model imperfect and unable to overcome the polarization aberration brought by the condenser and objective lens

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  • Method and device for calibrating polarization aberration of Muller microscope
  • Method and device for calibrating polarization aberration of Muller microscope
  • Method and device for calibrating polarization aberration of Muller microscope

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Embodiment Construction

[0024] The following embodiments of the present invention use the eigenvalue calibration method to realize the measurement and calibration of the Mueller matrix. We will see that the calibration method has the following advantages by the following description: (1) use a variety of Mueller matrix known standards Samples are used to fully model and calibrate the polarizer and analyzer modules, so there is no modeling error. (2) Error factors such as the initial position of the polarization device, the manufacturing error of the polarization device, and the polarization aberration of the system have all been included in the system model and calibrated through the calibration algorithm, so the requirements for system optical path adjustment and device selection are reduced. (3) Through the perfection of the system model and algorithm correction, the polarization aberration can be effectively overcome.

[0025] The following describes the embodiment in detail in several aspects.

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Abstract

The invention discloses a method and device for calibration of Muller microscopic polarization aberration. The method includes the following steps: S1. Perform the following image acquisition steps on standard samples and experimental samples respectively: make light pass through a polarizing module, a sample, and an objective lens 1. Arrive at the CCD after the deviation detection module, and use the CCD to carry out image acquisition; wherein the sample refers to the standard sample and the experimental sample; S2, after the data collection is complete, the data is processed, the algorithm is the eigenvalue calibration method, and finally the air experimental sample is calculated The Mueller matrix; the standard samples include: air standard sample, 0° polarizer standard sample, 90° polarizer standard sample and 30° wave plate standard sample. The invention is based on the eigenvalue calibration method, and uses four standard samples for calibration, which ensures the measurement accuracy and stability of the Muller microscope.

Description

technical field [0001] The invention relates to a calibration method and device for Muller microscopic polarization aberration. Background technique [0002] Mueller microscope is a combination of Mueller matrix measurement technology, Mueller matrix parameter extraction technology and microscopic imaging technology. Using Mueller microscope to perform polarization imaging on biological samples can obtain the complete Mueller image information of biological samples at the same time. Le matrix. In addition, the Mueller matrix decomposition technology and Mueller matrix transformation technology are used to process the Mueller matrix of the sample, and the polarization imaging parameters that are closely related to the biological microstructure and have clear physical meaning can be extracted from the Mueller matrix of the sample, such as Quantitative parameters describing the extent and direction of fibrosis in biological samples. These parameters can effectively assist in ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B21/36G02B27/00G01M11/00
Inventor 程雪岷余杰威马辉李懋林何宏辉
Owner SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV