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A device and method for testing dfb lasers and single photon detectors

A technology of DFB laser and single photon detector, which is applied in the direction of measurement device, optical instrument test, machine/structural component test, etc., and can solve the problems of multi-equipment and instruments, occupancy, etc.

Active Publication Date: 2019-08-16
BEIJING ZHONGCHUANGWEI NANJING QUANTUM COMM TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the existing test device needs to provide an external narrow pulse light source and optical attenuator, which takes up more equipment and instruments

Method used

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  • A device and method for testing dfb lasers and single photon detectors
  • A device and method for testing dfb lasers and single photon detectors
  • A device and method for testing dfb lasers and single photon detectors

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Embodiment Construction

[0069] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0070] Such as image 3Shown: An apparatus for testing detectors, optical devices, including a test circuit capable of outputting a synchronous clock signal and single photons to a single-photon detector device, and the single-photon detector device capable of inputting counting pulses to the test circuit , the test circuit includes a controller, a clock module, a time position measurement module, a light source module, a light attenuation module, and an optical splitter module; the controller is provided with a port capable of connecting with a man-machine switching device (including software) and multiple A port connected with the corresponding module; the input end of the clock module is connected with the controller and the synchronous clock signal output end of the clock module can be connected with the single photon detector device and the time po...

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Abstract

The invention discloses a device for testing DFB lasers and single photon detectors, comprising a test circuit, the test circuit includes a controller, a clock module, a time position measurement module, a light source module, an optical attenuation module, and a beam splitter module, and The test circuit composed of the above components can test the single photon detector device; the light source module includes a narrow pulse adjustment circuit, a DFB laser drive circuit, and a DFB laser fixture, and the test circuit composed of the light source module and the controller including the above components can Testing DFB lasers. The device of the present invention can avoid external light source equipment and optical attenuators, and the test method using the device can solve the detection efficiency, dark count probability, post-pulse probability, and test calibration problems of the effective gate width of the single photon detector; The test method can complete the test of the optical parameters and technical indicators of the DFB laser in the quantum secure communication.

Description

technical field [0001] The present invention relates to the technical field of quantum secure communication, in particular to a DFB laser and a single photon detector in quantum secure communication, specifically a device for testing a DFB laser and a single photon detector and a testing method thereof; the testing device And the test method can solve the detection efficiency, dark count probability, post-pulse probability, and effective gate width test calibration problems of single-photon detector equipment; it can complete the test of optical parameters and technical indicators of DFB lasers in quantum secure communication, and It can cover the factory parameter test of DFB manufacturers. Background technique [0002] In the existing field of quantum secure communication, the laser source uses DFB lasers to emit light; in the testing of DFB lasers by existing manufacturers, a power supply (voltage source or current source) is usually added to the positive pole and RF- or ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01M11/00
Inventor 陈建申子要高天
Owner BEIJING ZHONGCHUANGWEI NANJING QUANTUM COMM TECH CO LTD
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