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A Longitudinal Average System of Waveform Based on FPGA

An average and vertical technology, applied in the field of testing, can solve problems affecting average precision, error accumulation, multiple logic resources, etc., and achieve the effect of improving refresh rate, strong compatibility and scalability

Active Publication Date: 2020-07-31
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The advantage of this method is that the average efficiency is high. Every time a frame of raw data is processed, there will be an average data output. The disadvantage is that it needs to perform two division operations and multiple addition and subtraction operations, and it needs to consume more logic resources inside the FPGA. Realize the above four arithmetic operations, and the exponential average will cause error accumulation due to data truncation operation, which will affect the average accuracy

Method used

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  • A Longitudinal Average System of Waveform Based on FPGA
  • A Longitudinal Average System of Waveform Based on FPGA
  • A Longitudinal Average System of Waveform Based on FPGA

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Experimental program
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Embodiment

[0030] figure 2 It is a structural diagram of a specific embodiment of the FPGA-based waveform longitudinal averaging system of the present invention. like figure 2 As shown, the FPGA-based waveform longitudinal averaging system of the present invention includes an ADC module 1, a sampling module 2, a first FIFO module 3, a waveform longitudinal averaging control module 4, an adder 5, a second FIFO module 6, a divider 7, and a buffer Module 8, host computer 9 and display 10, wherein snapshot module 2, the first FIFO module 3, waveform vertical average control module 4, adder 5, the second FIFO module 6, divider 7, cache module 8 are in FPGA (Field -Programmable Gate Array, that is, field programmable gate array), each module will be described in detail below.

[0031] The ADC module collects the signal to be tested, and sends the collected data sequence ADC_DATA to the sampling module 2 .

[0032] The sampling module 2 performs sampling on the sampling data sequence ADC_D...

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Abstract

The invention discloses a waveform longitudinal average system based on FPGA. The signal to be measured is collected by the ADC module and stored in the first FIFO module after being sampled by the sampling module. The second FIFO module is used to store accumulated data. After effective triggering, the adder reads the snapshot data from the first storage module and simultaneously reads the accumulated data from the second FIFO module under the control of the waveform longitudinal average control module, and stores the summed data into the second FIFO as new accumulated data In the module, when the number of accumulated collected data reaches the number of vertical average times, the accumulated data is read by the divider from the second FIFO module, shifted and truncated to achieve the average, and the averaged result is stored in the cache module, which is read and sent to the host computer. into the display for display. The invention realizes the vertical average of the waveform through the FPGA, and can save storage resources while improving the refresh rate of the waveform.

Description

technical field [0001] The invention belongs to the technical field of testing, and more specifically relates to a waveform longitudinal averaging system based on FPGA. Background technique [0002] Oscilloscopes, as general testing instruments, are widely used in various industries, with functions such as real-time signal display, advanced triggering, protocol analysis, waveform search, and frequency measurement. In the oscilloscope mode of the oscilloscope, there is a vertical average mode, that is, for a periodic signal, N waveforms are continuously collected and stored, and then the N waveforms are arithmetically averaged before displaying. Its function is to eliminate channels superimposed on the periodic signal noise and quantization error. figure 1 It is a schematic diagram of the longitudinal average of the waveform. [0003] In the existing technology, there are three main ways to realize the vertical average of the waveform: [0004] The first method: the FPGA t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R13/02
CPCG01R13/0254G01R13/0272G01R13/029
Inventor 许波陈凯程玉华杨云鹏刘长剑贾树林王伊凡叶东坤赵佳
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA