A High Precision Wavelength Calibration Method Based on Interferometric Imaging Spectrometer

An interference imaging and wavelength calibration technology, applied in the field of interference spectrum signal processing, can solve problems such as low precision, and achieve the effect of simple calculation method, fast speed and high precision

Active Publication Date: 2021-01-08
NANJING UNIV OF SCI & TECH
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Problems solved by technology

[0005] The purpose of the present invention is to provide a high-precision wavelength calibration method based on an interference imaging spectrometer that solves the problem of low precision of the traditional wavelength calibration method

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  • A High Precision Wavelength Calibration Method Based on Interferometric Imaging Spectrometer
  • A High Precision Wavelength Calibration Method Based on Interferometric Imaging Spectrometer
  • A High Precision Wavelength Calibration Method Based on Interferometric Imaging Spectrometer

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Embodiment

[0041]The high-precision wavelength calibration method of the present invention based on interference imaging spectrometer includes the following contents:

[0042]1. Take monochromatic light with a wavelength of 632.8nm as the light source, and collect its interference fringe pattern through the interference imaging spectrometer.

[0043]2. Extract a line of interference fringe information from the interference fringe pattern to form an interference signal I such asfigure 2 As shown, due to the large number of cycles, in order to explain the problem more clearly, the interference signal is partially amplified, such asimage 3 Shown.

[0044]3. Expand the interference signal I to obtain a new signal Ie, New signal IeThe length of is M times the length of the interference signal I. In this embodiment, the value of M is 10000.

[0045]4. Get a new signal IeSpectrum intensity information FIe,Such asFigure 4 Shown.

[0046]5. Such asFigure 4 As shown, extract spectrum intensity information FIePeak K in...

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Abstract

The invention discloses a high-precision wavelength calibration method based on an interference imaging spectrometer. The method comprises the following steps of: collecting an interference fringe pattern by taking monochromatic light with a certain wavelength as a light source; extracting a certain row of interference fringe information from the interference fringe pattern to form an interferencesignal I; expanding the interference signal I to obtain a signal Ie with the signal length which is M times that of the signal I; acquiring spectrum intensity information FIe of the signal Ie; extracting the abscissa Ke of the peak value position in the frequency spectrum intensity information FIe, and obtaining a wave number position coordinate K according to the Ke and the M; taking a pluralityof monochromatic lights with different wavelengths as light sources, and repeating the process mentioned above; and performing curve fitting on the relation data of all the wavelengths and the corresponding wave number position coordinates, thereby obtaining a wavelength calibration result. The high-precision wavelength calibration method can obviously improve the positioning precision of the spectral line position in the wavelength calibration under the condition of not increasing much calculation complexity.

Description

Technical field[0001]The invention belongs to the field of interference spectrum signal processing, in particular to a high-precision wavelength calibration method based on an interference imaging spectrometer.Background technique[0002]Interference spectroscopy technology is: using the physical relationship between the interference signal and the spectrum signal, through the Fourier transform of the interference signal, the spectrum intensity information of the target can be restored. In practical applications, the abscissa of the spectrum curve obtained by Fourier transform is the wave number position, and the value of the wave number position needs to be converted to the value of the wavelength, so that the relationship curve between the spectral intensity and the wavelength can be obtained, which is a complete spectrum measurement. process. Therefore, it is necessary to calibrate the relationship between the wave number position and the wavelength, that is, the wavelength calibra...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/45G01J3/28
CPCG01J3/2823G01J3/45
Inventor 李建欣许逸轩柏财勋刘杰
Owner NANJING UNIV OF SCI & TECH
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