Virtual test platform and method for semiconductor devices

Abstract

The invention provides a virtual test platform and method for semiconductor devices. The virtual test platform and method are used for testing electrical performance of the semiconductor devices. Thevirtual test platform comprises a virtual test program and a virtual test interface developed by utilizing VI technology. The virtual test program comprises a data input and storage module, a test program operation module, a test result display module, a parameter extraction module and a stop module. According to the virtual test platform and method, through combining TCAD and VI technology, the semiconductor devices are constructed and different electrical performance test programs of the different semiconductor devices arecompiled. Expensive test instruments are not needed and the cost of anexperiment can be saved. The virtual test platform is simple and easy to understand, and convenient to operate.

Description

technical field [0001] The invention relates to the field of virtual simulation, in particular to a semiconductor device virtual test platform and a semiconductor device virtual test method. Background technique [0002] The current society has entered the information age, which is marked by the wide application of information technologies such as computers and the Internet. The cornerstone of information technology is microelectronics technology. Since this century, major colleges and universities have begun to vigorously strengthen the cultivation of microelectronics talents. [0003] The core of microelectronics technology is integrated circuit technology. At present, the feature size of integrated circuits decreases rapidly following Moore's law, and has entered the nanometer era from microns. The performance of semiconductor devices is the key factor determining the performance of integrated circuits. Therefore, the design, manufacture and testing technology of semico...

AI Technical Summary

Problems solved by technology

However, as far as the testing of semiconductor devices is concerned, it is necessary to be equipped with precise and expensive instruments and equipment. It is difficult for ordinary colleges and universities to have the financial resources to build supporting testing platforms for many students majoring in microelectronics. How to let students learn the design and operation of semiconductor devices without actual testing conditions Testing is a difficult problem faced by the experimental teaching of microelectronics majors in most colleges and universities

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