Electronic device fault diagnosis method based on grey correlation analysis and improved DS reasoning

A grey correlation analysis, electronic equipment technology, applied in transmitter monitoring and other directions, can solve problems such as failure diagnosis and fault prediction ability of node test equipment that cannot be used

Inactive Publication Date: 2019-07-26
HARBIN INST OF TECH
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  • Abstract
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Problems solved by technology

[0003] The purpose of the present invention is to solve the problem that the existing technology cannot adopt a si

Method used

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  • Electronic device fault diagnosis method based on grey correlation analysis and improved DS reasoning
  • Electronic device fault diagnosis method based on grey correlation analysis and improved DS reasoning
  • Electronic device fault diagnosis method based on grey correlation analysis and improved DS reasoning

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specific Embodiment approach 1

[0013] Specific implementation mode one: refer to figure 1 Specifically illustrate the present embodiment, the gray relational analysis described in the present embodiment and the electronic equipment fault diagnosis method of improved DS reasoning, described method comprises the following steps:

[0014] Step 1, extracting the fault features of the electronic equipment under test, and constructing a parameter subspace of each fault feature;

[0015] Step 2, adopting the method of gray relational analysis, calculating the gray relational degree of each fault feature parameter and the feature parameter in the fault type sample in the parameter subspace of each fault feature;

[0016] Step 3, select the fault corresponding to the characteristic parameter with the largest correlation degree from the obtained multiple gray correlation degrees, as the preliminary fault type of the electronic equipment under test;

[0017] Step 4. Probability assignment is carried out for each gray...

Embodiment

[0020] The electronic equipment fault diagnosis method of gray relational analysis and improved DS reasoning includes the following steps:

[0021] Step 1. Select the fault characteristic parameters of the gray relational analysis, and construct the fault characteristic parameter subspace;

[0022] The transmitter includes a modulator fault F 1 , local oscillator unit failure F 2 , filter fault F 3 , power amplifier failure F 4 Four standard failure types. The fault characteristic parameter subspace 1 consists of the modulator voltage U 1 , local oscillator voltage U 2 , filter voltage U 3 and amplifier voltage U 4 Composition, these parameters reflect the electrical characteristics. Fault characteristic parameter subspace 2 is composed of output power W, output signal frequency F and output signal amplitude D, and these parameters reflect the overall working performance of the equipment.

[0023] The samples of each standard failure mode are obtained, and the referen...

specific Embodiment approach 2

[0048] Specific embodiment two: this embodiment is to further explain the electronic equipment fault diagnosis method of the gray relational analysis and improved DS reasoning described in the specific embodiment one, in this embodiment, each gray relational degree in step two is carried out Probability assignment to get the basic probability assignment m(A i )for:

[0049]

[0050] where, γ i is the gray correlation degree between the fault characteristic parameter subspace and each fault type sample, m(Θ) represents uncertainty, m(Θ)=1-max(γ i )(i=1,2,...,n), max(γ i ) is the maximum value of the gray correlation degree between the fault characteristic parameter subspace and each fault type sample.

[0051] In this embodiment, the gray correlation degree of fault samples in each fault feature subspace is calculated according to the fault data of electronic equipment, and the result of gray correlation analysis is converted into the basic probability distribution of DS ...

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Abstract

The invention discloses an electronic device fault diagnosis method based on grey correlation analysis and improved DS reasoning, and relates to the technical field of fault diagnosis. The invention aims to solve the problem that fault diagnosis and fault prediction capabilities of node test equipment cannot be accurately realized by adopting a simple mode in the prior art. The method comprises: extracting fault characteristics of the tested electronic device to construct a parameter subspace of each fault characteristic; calculating the gray correlation degree of each fault characteristic parameter in the parameter subspace of each fault characteristic and the characteristic parameter in the fault type sample by adopting a gray correlation analysis method; selecting a fault correspondingto the characteristic parameter with the maximum correlation degree from the plurality of grey correlation degrees as a preliminary fault type of the tested electronic device; and performing probability assignment on each gray correlation degree to obtain a basic probability assignment of each fault type, and fusing the basic probability assignments by adopting an improved DS evidence reasoning fusion method to obtain a final fault type of the tested electronic device. The method is used for diagnosing electronic device faults.

Description

technical field [0001] The invention relates to a gray relational analysis and improved DS reasoning electronic equipment fault diagnosis method, in particular to an electronic equipment fault diagnosis method, which belongs to the technical field of fault diagnosis. Background technique [0002] For a complex electronic information system with a high degree of informatization, complex internal relationships and mutual influence, it is difficult to accurately describe the fault when a problem occurs in the system, making the relationship between the cause of the fault and the symptom appear random and uncertain, It is difficult to accurately locate the fault by judging whether there is a fault in the measured object by measuring whether the output signal is within its qualified range. Information fusion uses certain rules to analyze and comprehensively process multi-source information to achieve a consistent description of information sources. There are many information fus...

Claims

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Application Information

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IPC IPC(8): H04B17/17
CPCH04B17/17
Inventor 刘晓东杨京礼张宝琴
Owner HARBIN INST OF TECH
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