Embedded satellite-borne software test case generation method based on dynamic fault tree

Abstract

The invention provides an embedded satellite-borne software test case generation method based on a dynamic fault tree. The embedded satellite-borne software test case generation method comprises the following steps: (1) determining an on-orbit actual dynamic operation profile and an input space of tested software; (2) establishing a fault mode propagation path and a fault mode set of the operationprofile; (3) establishing a dynamic fault tree; (4) constructing a cutting sequence set corresponding to the dynamic fault tree, and determining a minimum cutting sequence set in the cutting sequenceset; (5) establishing test case input and expected output of the minimum cut sequence equivalent class, and generating a test case; (6) loading the test case, running the tested software, and takinginput data as execution input to obtain actual output; and (7) checking whether the actual output set is consistent with the expected output set. The test case generated by the method has the advantages of low coupling degree, high efficiency, high granularity and high reusability.

Description

technical field [0001] The invention relates to a method for generating test cases of embedded spaceborne software based on a dynamic fault tree, and belongs to the technical field of embedded software testing. Background technique [0002] The functional requirements of modern satellites are becoming more and more complex. However, due to the limitations of many factors such as test conditions and unknown space operating environments, the proportion of on-board software as a carrier for the realization of entire satellite functions is increasing. Potential software failures may lead to major economic losses. losses and casualties. One of the important means to improve the safety and reliability of spaceborne software is to conduct efficient and sufficient software testing. Covering more software requirement items and potential fault propagation paths with fewer test case sets, so as to improve test efficiency and save costs, has always been one of the important goals pursu...

AI Technical Summary

Problems solved by technology

On the one hand, these intelligent computing and analysis methods occupy a large amount of computing resources, and the model establishment takes a long time, so that the implementation and iteration of test cases cannot be well adapted to the embedded onboard software development model.

Usually more suitable for non-embedded software test verification, not very suitable for embedded software test verification

On the other hand, this method assumes that the software defects detected after executing the test cases are equivalent, and the relevance of the impact of different software defects on software quality is not considered when using the algorithm to design test cases.

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