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temperature measurement method

A temperature measurement and measurement point technology, applied in the field of temperature measurement and temperature measurement, can solve the problems of high cost of temperature measurement equipment and improved accuracy of temperature measurement results, and achieve the effect of saving equipment cost, improving measurement accuracy and small measurement error

Active Publication Date: 2021-09-03
LONGI GREEN ENERGY TECH CO LTD
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  • Description
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Problems solved by technology

[0004] The purpose of the present invention is to provide a temperature measurement method to solve the problems that the accuracy of the existing temperature measurement results needs to be improved and the cost of temperature measurement equipment is high

Method used

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Embodiment Construction

[0022] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0023] Such as figure 1 As shown, the temperature measurement method provided by the invention comprises the following steps:

[0024] The first step is to provide a thermometer, and use the thermometer to measure the temperature of a measurement point on the surface of the object to be measured to obtain a temperature measurement value.

[0025] In this embodiment, the surface of the object to be measured is the surface of the melt in the Czochralski single crystal furnace. Thermometer can choose infrared thermometer. The thermometer has a laser pointer. When the thermometer is used to measure the temperature of a certain point, the laser pointer emits a laser to indicate the position of the point.

[0026] A certain point on the surface to be measured is selected as the measurement point, and the thermometer is used to align the measure...

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Abstract

The temperature measurement method disclosed by the invention comprises the steps of: using a thermometer to obtain the temperature value of a certain measurement point on the surface to be measured; using a camera to simultaneously acquire an image of the surface to be measured; processing the acquired image to obtain the gray value of the measurement point obtaining the corresponding relationship between the temperature measurement value and the gray value; and obtaining an image of the point to be measured at a certain moment, and using the corresponding relationship to obtain the temperature measurement value of the point to be measured at the moment. The temperature measurement method of the present invention establishes a corresponding relationship by using the temperature values ​​measured at different time periods of a certain measurement point and the image gray value, and then the thermometer can be removed, and the image gray value of the point to be measured at a certain moment is substituted into the corresponding relationship, that is, The temperature value at this moment can be calculated. Moreover, there is no need to equip each furnace table with a thermometer. The present invention measures the temperature of the point to be measured according to the image of the point to be measured, without interference from the measurement distance, and the measurement range is only a small area around the point to be measured, with sensitive response and small measurement error. Helps improve measurement accuracy.

Description

technical field [0001] The invention belongs to the technical field of temperature measurement, and in particular relates to a temperature measurement method. Background technique [0002] Photovoltaic power generation, as one of the main energy sources for green energy and sustainable development of human beings, has been increasingly valued by countries all over the world and has been vigorously developed. As a basic material for photovoltaic power generation, monocrystalline silicon wafers have a wide market demand. A common single crystal silicon growth method is the Czochralski method, that is, in a single crystal furnace, the seed crystal is immersed in a melt contained in a crucible, and the seed crystal is pulled while rotating the seed crystal and the crucible, so that the The lower end of the crystal is sequentially seeded, shouldered, turned, equal-diametered, and finished to obtain a single crystal silicon rod. [0003] In order to ensure stable crystal pulling...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00C30B15/20C30B29/06
CPCG01J5/00G01J5/0037G01J5/0044C30B15/20C30B29/06G01J2005/0077G01J5/485
Inventor 郭力周锐李侨徐战军王正远赵会刚张伟建刘永生武高峰
Owner LONGI GREEN ENERGY TECH CO LTD
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