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Nonlinear frequency modulation pre-calibration method of semiconductor laser

A non-linear frequency modulation and laser technology, which is applied to instruments, optical devices, measuring devices, etc., can solve the problem of low correction accuracy, and achieve the effect of simple and fast method, easy implementation and easy realization.

Active Publication Date: 2019-08-20
XIAN TECHNOLOGICAL UNIV
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Problems solved by technology

[0004] The invention provides a non-linear frequency modulation pre-correction method for semiconductor lasers to overcome the problem of low correction accuracy in the prior art

Method used

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  • Nonlinear frequency modulation pre-calibration method of semiconductor laser
  • Nonlinear frequency modulation pre-calibration method of semiconductor laser
  • Nonlinear frequency modulation pre-calibration method of semiconductor laser

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Embodiment

[0039] A semiconductor laser nonlinear frequency modulation pre-correction method, comprising the steps of:

[0040] Step 1: The driving signal of the semiconductor laser is obtained by reading the data table by the microprocessor and converted by the DA circuit. The data table is composed of linear interpolation. The interference signal is converted into an electrical signal by a photodetector and then converted into a digital signal by an AD circuit. . Adjust the optical path difference between the signal light and the reference light so that the interference signal is in the effective interval T m There are 20 minima inside. In the case of ideal chirp, the minima are evenly distributed, and their coordinates on the time axis should be 1T m / 20, 2T m / 20,...19T m / 20.

[0041] Step 2: When non-linear frequency modulation exists, the distribution of minima is not uniform and not ideal, see figure 1 , at this time, the deviations between all actual minimum positions and ...

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Abstract

The invention relates to a nonlinear frequency modulation pre-calibration method of a semiconductor laser, and belongs to the technical field of optical frequency modulation continuous wave interference measurement. A deviation between a practical position and an ideal position of an extreme point of the interference signal waveform in each modulation period in the time axis is tested to determinethe magnitude of frequency modulation nonlinearity of the semiconductor laser, position of a point corresponding to the laser modulation signal waveform in the time axis is translated according to the deviation, the calibrated laser modulated waveform is obtained by sectional interpolation or nonlinear fitting, and frequency modulated continuous wave interference linearity of the semiconductor laser is calibrated. According to the method, computer aided detection can be used, the optimal modulated waveform is obtained by repeated iteration, the nonlinearity calibration precision is improved,and the method can be applied to different frequency modulation continuous wave interference measurement systems based on the semiconductor laser to improve the measuring precision.

Description

technical field [0001] The invention relates to the technical field of optical frequency modulation continuous wave interferometry, in particular to a semiconductor laser nonlinear frequency modulation pre-correction method. Background technique [0002] Optical frequency-modulated continuous wave (FMCW) interference is a new technology emerging in the 21st century. This optical interference technology requires the use of a coherent light source with continuous linear modulation of optical frequency, because only linear frequency modulation can obtain the beat frequency of the interference signal as one Constant, which is convenient to accurately identify the phase and its changes. At present, single-mode semiconductor lasers are considered to be the most suitable frequency-modulated coherent light sources, because the frequency modulation method of semiconductor lasers is relatively simple, and frequency modulation can be realized by directly modulating the driving current....

Claims

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Application Information

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IPC IPC(8): G01B9/02
CPCG01B9/02
Inventor 郑刚张雄星孙彬郭峰井李强王欢
Owner XIAN TECHNOLOGICAL UNIV
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