Remote and precise foundation vertical displacement measurement device and method

A technology of vertical displacement and precise measurement, which is applied in the direction of measuring device, optical device, height/horizontal measurement, etc. It can solve the difficulty of laser light source construction and other problems, and achieve the effect of optimizing measurement and ensuring accuracy

Inactive Publication Date: 2019-08-20
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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[0005] In view of this, the purpose of the present invention is to provide a device and method for remote and precise measurement of the vertical displacement of the

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  • Remote and precise foundation vertical displacement measurement device and method
  • Remote and precise foundation vertical displacement measurement device and method

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[0020] In order to make the objectives, technical solutions, and advantages of the present invention clearer, the following further describes the present invention in detail in conjunction with specific embodiments and with reference to the accompanying drawings.

[0021] The invention provides a device and method for remotely accurately measuring the vertical displacement of a foundation, such as figure 1 As shown, the device includes a laser light source, a first reflecting mirror, a second reflecting mirror, a focusing lens and a CCD in sequence along the optical path, among which:

[0022] The first reflecting mirror and the second reflecting mirror are 45° reflecting mirrors. The first reflecting mirror receives the horizontal light emitted by the laser light source, and changes the horizontal light 90° clockwise on the horizontal plane and reflects it to the second reflecting mirror , The second reflector changes the horizontal light by 90° in the clockwise direction on the ho...

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Abstract

The invention discloses a remote and precise foundation vertical displacement measurement device and method. The remote and precise foundation vertical displacement measurement device comprises a laser source, a first mirror, a second mirror, a focusing lens and a charge coupled device in sequence along an optical path, wherein the first mirror and the second mirror are 45-DEG mirrors; the first mirror receives horizontal light emitted by the laser source, changes the horizontal light for 90 DEG along a clockwise direction in a horizontal plane and reflects the light to the second mirror; thesecond mirror changes the horizontal light for 90 DEG again along the clockwise direction in the horizontal plane and reflects the light to the focusing lens; and the focusing lens focuses the horizontal light to the receiving screen of the charge coupled device, a light spot is obtained on the receiving screen, and imaging on the screen is realized. The remote and precise foundation vertical displacement measurement device and method provided by the invention can accurately measure the displacement of the foundation in a vertical direction, and the measurement difficulty is reduced.

Description

technical field [0001] The invention belongs to the field of optical precision measurement, and in particular relates to a device and method for remote and precise measurement of vertical displacement of foundation. Background technique [0002] At present, the construction of railways, highways and bridges has put forward higher and higher requirements for the control of foundation stability, especially the construction standards and technical requirements of high-speed railways are often much higher than ordinary railways. In order to ensure the stability and safety of high-speed driving, High-speed railways must ensure high track stability. The vertical displacement of the foundation will cause the rails to bend and even the road surface to break, which will bring great hidden dangers to traffic and building safety. The invention provides a method for remotely and precisely measuring the vertical displacement of the foundation, which can accurately measure the displaceme...

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Application Information

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IPC IPC(8): G01C5/00G01B11/02
CPCG01B11/02G01C5/00
Inventor 林学春杨盈莹杨松许本有张勇
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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