Device parameter measurement method and system and terminal equipment

A measurement method and technology of device parameters, applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve problems such as inaccurate measurement of device parameters, and achieve the effect of improving measurement accuracy

Active Publication Date: 2019-08-27
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In view of this, the embodiment of the present invention provides a device parameter measurement me

Method used

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  • Device parameter measurement method and system and terminal equipment
  • Device parameter measurement method and system and terminal equipment
  • Device parameter measurement method and system and terminal equipment

Examples

Experimental program
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Embodiment 1

[0029] figure 1 It shows the implementation flow chart of the method for measuring device parameters provided by an embodiment of the present invention. For the convenience of description, only the parts related to the embodiment of the present invention are shown, and the details are as follows:

[0030] Such as figure 1 As shown, a method for measuring device parameters provided by an embodiment of the present invention includes:

[0031] S101, acquiring the measurement data of the device under test and the error parameters of the load-pull measurement system, the measurement data being the voltage wave measured by the internal receiver of the vector network analyzer in the load-pull measurement system based on the measurement of the device under test;

[0032] S102. Calculate parameters of the device under test by using the measurement data and error parameters of the load pull measurement system.

[0033] In this embodiment, the measurement data is the real-time voltage ...

Embodiment 2

[0104] Such as Image 6 As shown, the system provided by one embodiment of the present invention includes:

[0105] Vector network analyzer 1, source-end impedance adjuster 2, load-end impedance adjuster 3, source-end dual-directional coupler 4, load-end dual-directional coupler 5, and terminal equipment 21;

[0106] The first end of the source impedance adjuster 2 is used to connect the source signal source, the second end of the source impedance adjuster 2 is connected to the first end of the source dual directional coupler 4, the source The second end of the double-ended directional coupler 4 is connected to the first probe, and the first probe is used to connect the device under test 6;

[0107] The first end of the load end impedance adjuster 3 is used to connect the load end signal source, the second end of the load end impedance adjuster 3 is connected to the first end of the load end dual directional coupler 5, the load end The second end of the double-ended directio...

Embodiment 3

[0160] Figure 9 It is a schematic diagram of a terminal device provided by an embodiment of the present invention. Such as Figure 9 As shown, the terminal device 21 in this embodiment includes: a processor 910 , a memory 911 , and a computer program 912 stored in the memory 911 and operable on the processor 910 . When the processor 910 executes the computer program 912, it realizes the steps in each embodiment as described in Embodiment 1, for example figure 1 Steps S101 to S102 are shown. Alternatively, when the processor 910 executes the computer program 912, it realizes the functions of the terminal device in each system embodiment as described in Embodiment 2, for example Figure 7 The functions of modules 2100 to 2200 are shown.

[0161] The terminal device 21 refers to a terminal with data processing capabilities, including but not limited to computers, workstations, servers, and even smart phones with excellent performance, palmtop computers, tablet computers, per...

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Abstract

The invention provides a device parameter measurement method and device and terminal equipment. The method comprises the steps of obtaining measured data of a to-be-measured device and an error parameter of a load pull measurement system, wherein the measured data is a voltage wave measured by an internal receiver of a vector network analyzer in the load pull measurement system on the basis of theto-be-measured device; and calculating a parameter of the to-be-measured device by utilizing the measured data and the error parameter of the load pull measurement system. Through obtaining the real-time measured data, measured by the vector network analyzer, of the to-be-measured device, the parameter of the to-be-measured device can be calculated in real time without being influenced by the mechanical repeatability of an impedance tuner, so that the measurement accuracy for the parameter of the to-be-measured device is improved.

Description

technical field [0001] The invention belongs to the technical field of semiconductors, and in particular relates to a device parameter measurement method, system and terminal equipment. Background technique [0002] Due to its measurement model, the current load-pull measurement system needs to use a vector network analyzer to pre-characterize the source and load impedance states at each frequency point during the self-calibration process, and then store them in the software. Then configure the impedance adjuster to the same impedance state, and call out the stored data. At present, the load-pull measurement system is used to measure the device under test. Because the mechanical repeatability of the load-pull measurement system has a great influence on the test accuracy, the measurement of the device to be tested by the load-pull measurement system is inaccurate, resulting in the final calculation of the device under test. The parameters are not accurate. Contents of the ...

Claims

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Application Information

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IPC IPC(8): G01R35/00
CPCG01R35/005
Inventor 王一帮霍晔栾鹏吴爱华梁法国张立飞李彦丽张晓云
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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