FLASH module combination method based on genetic algorithm

A technology of module combination and genetic algorithm, applied in the direction of genetic rules, gene models, calculations, etc., can solve the problems of low combination accuracy, time-consuming and laborious, etc., and achieve the effect of improving efficiency and reliability

Active Publication Date: 2019-09-10
XIAN MICROELECTRONICS TECH INST
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0003] At present, the FLASH module combination method mainly adopts the manual selection method, which is time-consuming and laborious, and the combination accuracy is low

Method used

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  • FLASH module combination method based on genetic algorithm
  • FLASH module combination method based on genetic algorithm
  • FLASH module combination method based on genetic algorithm

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Embodiment

[0045] Each solid-state memory unit contains 4 storage arrays. The storage array uses FPGA as the control core and 21 pieces of FLASH storage modules to form the storage array. Each storage module has 8 chips inside, and the same storage module has 8 chips. The substrate shares the control and data buses, and the hardware structure diagram of the solid-state memory storage array is shown in figure 2 Show.

[0046] The FLASH storage module on the storage array is 3DFN32G08VS467MSA00M, with a capacity of 32G and 8 substrates sealed inside. The FLASH storage module is produced by Micron, with a capacity of 4G. Each substrate is divided into 4096 blocks (Block), and each block is divided into 64 pages (Page), and the capacity of each page is (2K+64) Bytes.

[0047] The two solid-state memories have 8 storage arrays in total, and each storage array needs to be installed with 21 FLASH storage modules, and each FLASH storage module is packaged with 8 substrates, which requires 168 ...

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Abstract

The invention discloses a FLASH module combination method based on a genetic algorithm. The FLASH storage modules are combined by adopting a genetic algorithm. The method mainly comprises two parts ofmathematical model establishment and algorithm realization. The method comprises the following steps: establishing a mathematical model, calculating the mathematical model through an algorithm, solving an optimal combination, quickly realizing the combination of FLASH modules, performing the algorithm by using MATLAB, and when the number of evolutions is 1000, the operation time being about 40s and being far less than the time of a manual selection method. The capacity of the combined FLASH module is fully utilized, so that the reliability of the solid-state memory is improved.

Description

technical field [0001] The invention belongs to the technical field of electronic information, and in particular relates to a FLASH module combination method based on a genetic algorithm. Background technique [0002] Storage capacity is an important indicator of onboard solid-state storage, and bad blocks are the most important factor affecting the capacity of solid-state storage. On the one hand, there are a certain number of initial bad blocks in the FLASH memory chip due to the process and other reasons, and on the other hand, a certain number of bad blocks will also increase during its use. As the number of bad blocks in the FLASH memory chip increases, the storage capacity of the solid-state memory will decrease accordingly. In order to ensure that the storage capacity at the end of the service life of the solid-state memory meets the reliability design requirements, it is necessary to select and combine the used FLASH memory modules, namely Select M (N≥M) from N FLAS...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F3/06G06N3/12
CPCG06F3/0679G06F3/0617G06F3/0629G06N3/126Y02P90/30
Inventor 邵明强刘晓飞
Owner XIAN MICROELECTRONICS TECH INST
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