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X-ray inspection apparatus

An inspection device and X-ray technology, which is applied in X-ray equipment, measuring devices, radiation measurement, etc., can solve the problem that the temperature change of the X-ray detection part cannot be suppressed, and achieve the effect of suppressing the temperature change

Pending Publication Date: 2019-10-08
ISHIDA CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the above-mentioned conventional X-ray inspection apparatus, although the cooling of the X-ray irradiation part can be realized, the temperature change of the X-ray detection part cannot be suppressed.

Method used

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Embodiment Construction

[0019] Hereinafter, preferred embodiments of one aspect of the present disclosure will be described in detail with reference to the accompanying drawings. In addition, in description of drawings, the same code|symbol is attached|subjected to the same or corresponding part, and repeated description is abbreviate|omitted. exist figure 1 , figure 2 as well as Figure 5 In the figure, for convenience of explanation, directions of "up", "down", "left", "right", "front", and "rear" are set, but the embodiment is not limited to these directions.

[0020] Such as Figure 1 to Figure 4 As shown, the X-ray inspection apparatus 1 includes a housing 2 , a support leg 3 , a transport unit 5 , an X-ray irradiation unit 6 , an X-ray detection unit 7 , a display operation unit 8 and a control unit 10 . The X-ray inspection apparatus 1 generates an X-ray transmission image of the article G while conveying the article G, and performs an inspection of the article G based on the X-ray transm...

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Abstract

An X-ray inspection apparatus includes an X-ray emitter configured to emit an X-ray; an X-ray detector configured to detect the X-ray; a first flow passage configured to guide air to at least part ofthe X-ray detector; and a second flow passage configured to guide air to at least part of the X-ray detector.

Description

technical field [0001] The present disclosure relates to X-ray inspection devices. Background technique [0002] As a conventional X-ray inspection apparatus, for example, an apparatus described in Patent Document 1 is known. The X-ray inspection apparatus described in Patent Document 1 (Japanese Patent Application Laid-Open No. 2001-318062 ) includes an air passage for guiding heat generated from an X-ray irradiation unit (X-ray generator) to the outside, and a part of the air passage. A substrate that seals the X-ray irradiating portion, and a cooling fin that penetrates the substrate and transfers heat generated in the X-ray irradiating portion to the air passage. In the X-ray inspection apparatus disclosed in Patent Document 1, cooling of the X-ray irradiation section can be realized. [0003] The X-ray inspection apparatus includes an X-ray detection unit such as a line sensor that detects X-rays irradiated by the X-ray irradiation unit. In such an X-ray detection un...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/04
CPCG01N23/04G01N2223/03G01N2223/1016G01N2223/3103G01N2223/3106G01T7/00G01V5/22G01N23/043G01N23/18G01N2223/643G01N2223/646G01N2223/652H05G1/025
Inventor 近藤慎吾
Owner ISHIDA CO LTD