Optimal Adaptive Microscopic Imaging Method and Device Based on Machine Learning

A technology of machine learning and microscopic imaging, which is applied in the fields of instruments, image enhancement, image data processing, etc., can solve problems such as complex compensation algorithm, slow imaging speed, and difficult realization of AO compensation distortion phase

Active Publication Date: 2021-08-20
TSINGHUA UNIV
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  • Abstract
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  • Application Information

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Problems solved by technology

However, there are two problems in the existing AO method: 1. When the aberration distortion is larger than the range that the modulator can change, especially under the long-wavelength laser for nonlinear optical imaging, it is often difficult to achieve the optimal AO compensation distortion phase; 2. .The compensation algorithm is complex and the imaging speed is slow

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  • Optimal Adaptive Microscopic Imaging Method and Device Based on Machine Learning
  • Optimal Adaptive Microscopic Imaging Method and Device Based on Machine Learning
  • Optimal Adaptive Microscopic Imaging Method and Device Based on Machine Learning

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Embodiment Construction

[0029] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0030] Before introducing the optimized adaptive microscopic imaging method and device based on machine learning, the functions to be realized by the present invention will be briefly introduced.

[0031] The problem to be solved by the present invention is: using a point-scanning optical microscope combined with an adaptive optics method of machine learning, it can also obtain fast, high-optimization performance and high-quality imaging capabilities when the distortion exceeds the range of the wavefront modulator.

[0032] Point...

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Abstract

The invention discloses a machine learning-based optimized self-adaptive microscopic imaging method and device, wherein the method includes the following steps: using ultrashort pulse laser to collect image data through a point scanning method; constructing a convolutional neural network to input The simulation results obtained from the image data to the physical model train the network; apply the trained training network to the adaptive method, optimize the imaging result, and eliminate image distortion, and use the model fitting method to find the optimal phase of the system and sample distortion correction compensate. This method can obtain imaging results with high optimization performance, high image quality, and high imaging speed, and has the advantages of high speed, high image quality, and good scalability, and realizes high-speed wavefront distortion compensation based on machine learning. It has great application prospects in deep tissue imaging.

Description

technical field [0001] The present invention relates to the technical field of microscopic imaging, in particular to an optimized self-adaptive microscopic imaging method and device based on machine learning. Background technique [0002] AO (Adaptive Optical, Adaptive Optics) was originally a method applied to astronomical telescopes, and it has been applied to optical microscopes due to its ability to correct the aberrations introduced by optical systems and biological samples. It works by dynamically measuring the distortion accumulated by light in a non-homogeneous sample and correcting for the distortion with active optical elements, thereby restoring diffraction-limited imaging performance deep in scattering tissue. To restore ideal imaging performance, the AO method measures the wavefront distortion present during image formation and corrects the wavefront accordingly to compensate for the inherent distortion of the optical system or sample. There are many AO methods...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06N3/04G06T5/00
CPCG06T5/006G06N3/045
Inventor 戴琼海赵志锋谢浩孔令杰
Owner TSINGHUA UNIV
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